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Reliable Opto-Electronic Characterization for DC and RF Values The opto-electronic test station NanoTest PIC HD complies with all requirements for the testing of high-density photonics integrated circuits, such as silicon photonics structures or active PICs. Probe cards with up to several hundreds of contacts provide the connection for DC and RF measurements.
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NanoHybrid provides a large degree of versatility. The active alignment, test and assembly station combines various assembly methods including gluing, laser welding or selective laser soldering. In addition, the station offers opto-electronic testing capability. Therefore, NanoHybrid is ideally suited for the development and small serial production in manufacturing companies or in research institutes. In such a product development area, an active alignment station needs to cope with opto-electronic and other precision devices with varying sizes and characteristics.
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