NanoTest PIC HD
Description
Reliable Opto-Electronic Characterization for DC and RF Values The opto-electronic test station NanoTest PIC HD complies with all requirements for the testing of high-density photonics integrated circuits, such as silicon photonics structures or active PICs. Probe cards with up to several hundreds of contacts provide the connection for DC and RF measurements.
- Import-export - electrical and electronic equipment
- NanoTest PIC
- Characterization NanoTest
Documents
Similar products
ROVIMEX BATTERY AND ENERGY TECHNOLOGIES
Turkey
Economical and easy-to-use desoldering wire. ESD protective product. Dimensions: 1.5mx 1.0 mm Zero Cycle Count, so you have the maximum amount of cycles remaining. Lithium-Ion Polymer technological materials Strict QC test Less than 1% failure rate 12 Yes Garanti
Request for quotes
Create one request and get multiple quotes form verified suppliers.
- Only relevant suppliers
- Data privacy compliant
- 100% free