Thickness measurement - Import export

The application possibilities of the scanning electron microscope, SEM in combination with the energy dispersive X-ray microanalysis, EDX are manifold. The areas of application listed here are only examples of some of the applications. Many other questions can be clarified with our microtextural and microanalytical test methods. Our services for you: X-ray microanalysis, EDX element mappings, line scans, SEM imaging, particle size determination, fiber thickness measurement, damage assessment

The Automatic Packaging Unit for Semi-Finished Lenses is dedicated to large scale packaging requirements of progressive semi-finished lenses. It packages 720 lenses per hour by choosing the correct plastic cup and box type out of ten cup choices and five box types. After being correctly matched to cup and box, the lens is packaged and sorted into 24 double magazines of 15 packaged lenses each, according to several different criteria that is operator set. Through the use of this machine with the Fully Automatic Pad Printing Unit for Semi – Finished Lenses, complete control and packaging is obtained with almost no operator intervention. By adding several options of diameter, center thickness, and curvature measurements, the machine can be used for packaging single vision and multifocal semi-finished lenses.

Ideal if the board needs to be moved throughout the day from location to location or to be locked in a safe overnight The Keytracker key drop box can be mounted to the wall The horizontal unit is designed to stand alone as a secure post box The medium chute is suitable for walls between 185mm and 300mm thick This will accept items measuring up to 130mm x 50mm x 40mm The faceplate measures 224mm (W) x 160mm (H) and is angled at 45 degrees The drop box which is attached to the chute above is fitted on the inside of the wall/building and the dimensions are 445mm (H) x 205mm (W) x 185mm (D). This is 1.2mm thick steel and has heavy-duty hinges.

Find Beam Profilers, Spectrophotometers, Autocollimators, Laser Characterisation and more Metrology & Analysis Systems Components. These include instruments used for thickness measurement, optics characterization, spectrophotometry, photoluminescence, optical monitoring, fluorescence lifetime analysis, angular light distribution, beam characterization and more. Order online all types of metrology sytems available for purchase. Request a Quote Online. Find all metrology systems from all worldwide suppliers in one site.