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Early warning and forecasting of the deterioration of engineering materials operating in extreme conditions is a high priority activity within many industrial plants. The ability to perform diagnostics on a plant’s metal work without taking it offline is particularly of high value to industries in the energy, processing and other sectors. Currently diagnostic equipment is only able to discover deterioration in operational pipework and associated equipment after its condition has already reached a dangerous stage of degradation. SOLVER Pipe is a new highprecision and reliable diagnostic system that allows plant managers the ability to decrease risks and achieve incidentfree operation through anticipatory control and scheduled maintenance of materials and equipment within their industrial facilities.Advantage over electron microscopy compact, cheap and does not require complex vacuum technology.

Electrical characterization of objects, that are weakly attached to the surface, has always been a challenge when using standard AFM modes like Conductive AFM. This was because often the tip moved or abraded the objects of interest. HybriD Mode drastically decreased the impact of lateral forces and simplified these experiments. Comparison of conductive and mechanical maps shown in this example allows the clear identification of single nanotubes and bundles. New stateoftheart HybriD 2.0 control electronics allows simultaneous resonant electrostatic studies using twopass technique Kelvin Probe Force Microscopy Electrostatic Force Microscopy Scanning Capacitance Force Microscopy

In HD Piezoresponse Force Microscopy mode (HD PFM) an AC voltage is applied to the conductive AFM cantilever when the tip comes in contact with the sample during each fast force spectroscopy cycle. Applied AC voltage causes mechanical oscillations of the piezoelectric (ferroelectric) sample.Corresponding vertical and lateral motions of the AFM tip are recorded and processed to get the amplitude and phase characterizing the local piezoelectric coefficient and local polarization direction respectively. Since the AFM tip retracts from the surface in each scanning point, the lateral tipsample interaction force is significantly reduced in comparison to the conventional contact PFM technique. This provides new capabilities for piezoresponse studies of soft, loose and fragile objects like biological samples, nanoparticles etc. Furthermore an AFM cantilever of higher stiffness and resonance frequency can be used.