Hd Piezoresponse Force Microscopy

Features

Description

In HD Piezoresponse Force Microscopy mode (HD PFM) an AC voltage is applied to the conductive AFM cantilever when the tip comes in contact with the sample during each fast force spectroscopy cycle. Applied AC voltage causes mechanical oscillations of the piezoelectric (ferroelectric) sample.Corresponding vertical and lateral motions of the AFM tip are recorded and processed to get the amplitude and phase characterizing the local piezoelectric coefficient and local polarization direction respectively. Since the AFM tip retracts from the surface in each scanning point, the lateral tipsample interaction force is significantly reduced in comparison to the conventional contact PFM technique. This provides new capabilities for piezoresponse studies of soft, loose and fragile objects like biological samples, nanoparticles etc. Furthermore an AFM cantilever of higher stiffness and resonance frequency can be used.

  • Optical measuring equipment
  • Hybrid Piezoresponse
  • Afm Probe
  • Electrostatic Measurements

Domain icon Manufacturer/ Producer

124460 Moscow - Russia

Contact

Request for quotes

Create one request and get multiple quotes form verified suppliers.

  • Only relevant suppliers
  • Data privacy compliant
  • 100% free