Russia
Manufacturer/ Producer
Russia
Highperformance versatile AFM Optical access from top, side and bottom optimized for Raman, TERS and SNOM Flexible optical design providing any combination of excitation/collection configurations Automated AFM laser, probe and photodiode alignment Userfriendly change of wavelength of AFM registration system laser and photodiode Easy and userfriendly change of objectives Integration with IR sSNOM (optional) Since 1998 NTMDT has been successfully integrating AFM with optical microscopy and spectroscopy techniques. More than 30 basic and advanced AFM modes including HybriD ModeTM are supported providing extensive information about the sample surface physical properties. Integration of AFM with confocal Raman/fluorescence microscopy provide the widest range of additional information about the sample. Simultaneously measured AFM and Raman maps of exactly the same sample area provide complementary information about sample physical properties (AFM) and chemical composition (Raman).
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IR s‑SNOM microscopy and spectroscopy with 10 nm spatial resolution Wide spectral range of operation 312 μm Incredibly low thermal drift and high signal stability Versatile AFM with advanced modes SRI (conductivity), KPFM (surface potential), SCM (capacitance), MFM (magnetic properties), PFM (piezoelectric forces) HybriD Mode™ quantitative nanomechanical mapping Integration with microRaman (optional) The ability of s‑SNOM measurements in the visible spectral range (optional) NTMDT Spectrum Instruments presents NTEGRA Nano IR scattering scanning nearfield optical microscope (s‑SNOM) designed for infrared (IR) spectral range. AFM probe is located in the focus of optical system which excites sample structure by IR laser and collects the optical response. Collected light is directed to Michelson interferometer for optical analysis.
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NTEGRA is a multifunctional device for performing the most typical tasks in the field of Scanning Probe Microscopy. The device is capable of performing more than 40 measuring methods, what allows analyzing physical and chemical properties of the surface with high precision and resolution. It is possible to carry out experiments in air, as well as in liquids and in controlled environment. The new generation electronics provides operations in highfrequency (up to 5MHz) modes. This feature appears to be principal for the work with highfrequency AFM modes and using highfrequency cantilevers.* There are several scanning types implemented in NTEGRA scanning by the sample, scanning by the probe and dualscanning. On account of that, the system is ideal for investigating small samples with ultrahigh resolution (atomicmolecular level) as well as for big samples and scanning range up to 100x100x10 µm.
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Industry leading automation level Outstanding noise floor and thermal drifts Fast scanner with XYZ lownoise closeloop Routine atomic resolution 60+ SPM modes in basic configuration Continuous zoom from millimeter to nanometer range Integrated with new Atomic Force Microscopy technique HybriD Mode™ Atomic Force Microscope NEXT provides motorized sample positioning and integrated high resolution optical microscope positioning, motorized continuous zoom and focusing of the optical microscope. But AFM automation is more than just motorization. Powerful Nova PX software algorithms remove a gap between optics and AFM providing continuous zoom from huge panoramic optical view down to atomic resolution. Since all step movers are coupled together with the optical image, NEXT provides autofocus, fast oneclick cantilever alignment, panoramic optical view and multiple scanning on 5×5 mm range.Cantilever recognition and automatic laser alignment both in liquid and air Autofocus
Request for a quoteNT-MDT LLC develops research instrumentation and scientific equipment: scanning probe microscopes, systems combining methods of scanning probe and optical microscopy and spectroscopy. The latest developments of NT-MDT S.I. include laboratory instruments and tools: • automated AFM VEGA with 200 mm wafer holder; • NTEGRA Nano IR combined system; • NTEGRA Spectra II automated combined system; • NEXT II fully automated AFM/STM for scientific research; • SOLVER Pipe II AFM for non-destructive tests of engineering materials. Key features of the scientific research equipment by NT-MDT are: • the widest range of AFM modes delivered in standard configurations • the highest level of automation at different levels, including self-testing, automated configuration for the selected AFM mode, adjusting the AFM sensor, laser alignment, tuning of scanning parameters, correlating video and scanned images; • lowest thermal drift The NT-MDT team has been developing and manufacturing equipment for studying the properties of nanoscale objects and has been providing support of research instrumentation and scientific equipment for over 30 years. The brands NT-MDT and NT-MDT Spectrum Instruments are recognized by scientists around the world. The company has produced more than 4000 scanning probe systems and microscopes for laboratories in 60 countries. NT-MDT LLC distributes its products through representative offices in Russia, Europe, USA and China.
Germany
New craft 6: Environmentally friendly electroless nickel plating. Nickel plating in strict accordance with customer requirements,we can control the accurate thickness.
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When it comes to a high quality IR Cut filter, it is the substrate with the coating applied that affects the performance. Knight Optical provide high quality wafers for precisely this, and the surface quality of our substrates eliminates blotching at the sensor which occurs on lower quality substrates especially where IR Cut filters are concerned. Our wafers are produced as thin as 500μm & provide exceptional surface quality. However, we can manufacture to a fully customised specification with a wafer thickness as little as 10 μm. Our substrates for stock or custom can be manufactured from a great deal of materials including: •Quartz •Borosilicate •BK7 or equivalent •Sapphire •And many more. Depending on your application for the IR Cut Filter, we can help advise on the best achievable optic for your application. Please read PDF for full specification
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We carry out applied research in our own test field and laboratory in order to constantly further develop our products, but also so as to be able to present our customers with innovative new developments. Furthermore, we regularly participate in cooperative projects of the Federal PhysicalTechnical Institute (PTB PhysikalischTechnische Bundesanstalt) with the economy. We also maintain close cooperative links with the universities of DuisburgEssen and Karlsruhe. We would also like to support you in research with our products. Please contact us.
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