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NTEGRA is a multifunctional device for performing the most typical tasks in the field of Scanning Probe Microscopy. The device is capable of performing more than 40 measuring methods, what allows analyzing physical and chemical properties of the surface with high precision and resolution. It is possible to carry out experiments in air, as well as in liquids and in controlled environment. The new generation electronics provides operations in highfrequency (up to 5MHz) modes. This feature appears to be principal for the work with highfrequency AFM modes and using highfrequency cantilevers.* There are several scanning types implemented in NTEGRA scanning by the sample, scanning by the probe and dualscanning. On account of that, the system is ideal for investigating small samples with ultrahigh resolution (atomicmolecular level) as well as for big samples and scanning range up to 100x100x10 µm.