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HD Scanning Thermal Microscopy (HD SThM) allows studying local thermal properties simultaneously with QNM measurements. From the hardware point of view it was implemented using AppNano VertiSense™ thermocouple probes. The thermal conductivity and temperature mapping modes (CMM, TMM) can be realized by positioning the AFM laser at the end or the central part of the probe, respectively. HD mode working principle allows exceptional spatial resolution of SThM measurements in comparison to conventional Amplitude Modulation (AM) mode. That was demonstrated in TMM of a microheater sample. SThM and HybriD mode is the winning combination for distinguishing between the constituents of polymer blends as demonstrated in the example of a blend of polystyrene (PS) with low density polyethylene (LDPE) (see below). The difference in thermal conductivity of the polymers (PS – 0.12 W/mK; LDPE – 0.33 W/mK) allows the assignment of the colder matrix to LDPE and the hotter islands to PS.

Tip Enhanced Raman Scattering (TERS, nanoRaman) is the technique for enhancement of weak Raman signals and for superresolution Raman imaging with spatial resolution less than 10 nm. As a result of comprehensive research performed together with NTMDT SI customers and partners, we are now able to offer to AFMRaman customers mass produced reproducible TERS probes. TERS imaging requires prolonged tipsample contact at each scanning point but Contact AFM is destructive for both the tip and the sample. Thereby, HD mode is a superior technique for cantilevertype TERS since it noticably increases the tip lifetime and makes possible TERS imaging of soft, loose and fragile samples. Vacuum measurements in amplitude modulation (AM) mode requires unacceptably low scanning speeds because of extremely high Qfactor of AFM probes. Being a nonresonant mode, HD mode allows at least 10 times faster imaging speed.

Stateoftheart HybriD 2.0 Control Electronics incorporates highspeed digital lockin amplifiers (LIA) and phase locked loop detector (PLL) for advanced oscillatory resonance modes Amplitude Modulation with Frequency Imaging (AMFI) and Frequency Modulation (FM) modes. They provide exceptional level of spatial resolution of challenging flat and soft samples (selfassembled molecular structures etc.) thanks to ultraprecise control of the tipsample interaction force. Additionally they allow mapping of its mechanical properties. The two images below show topography and probe resonant frequency distribution over lamellar arrangement of short alkane C36H74 on graphite with a spacing of 4.5 nm. One can also see a couple of adsorbates formed on the lamellar surface by disordered alkane chains which are rarely observed by the traditional AM mode.

(OEM manufacturing) Manufactured according to customer specifications, completely assembled and tested.

Manufactured according to customer specifications, completely assembled and tested.

Rebirth of Force Spectroscopy Advanced Nanomechanical, Electrical, Optical, Thermal and Piezoresponse Studies Fast Quantitative Nanomechanical Measurements and Force Volume Simultaneous Electrostatic and Nondestructive Conductivity, Piezoresponse and Thermal Studies Advanced CantileverType TipEnhanced Raman Scattering and Scanning NearField Optical Microscopy Topography in Attraction and Repulsive Regimes Young’s Modulus and Force Volume Adhesion and Work of Adhesion Conductivity InPlane and OutofPlane Piezoresponse Temperature and Thermal Conductivity Thermoelectric Electrostatic Kelvin Probe Force, Electrostatic Force and Scanning Capacitance Force Microscopy NearField Component of Optical Response TipEnhanced Raman Scattering In HybriD mode the tipsample distance is modulated according to the quasiharmonic law.

Dedicated imaging, analysis and metrology software for scanning 3D surface profilometers using contact or non-contact techniques - including stylus profilers, laser triangulation profilers, confocal point sensor profilers, auto-focus profilers and white light interferometers Compatible with all scanning 3D surface profilometers used for surface analysis and metrology. Real time 3D imaging of surface topography - at any zoom level, angle and height amplification. Correct measurement artifacts - spikes, anomalous scan lines, missing data points, tip impact. Analyze surface geometry - distances, angles, areas, volumes, step heights, coplanarity. Apply advanced roughness/waviness filtering techniques - defined in ISO 16610. Analyze surface texture - in accordance with the latest ISO and national standards, including ISO 25178 and ISO 4287. Extract and analyze sub-surfaces - study them just like full measured surfaces. Increase profilometer vertical range virtually in software - combine measurements made at different heights. Easy integration into lab and production environments - export of all numerical results. Add optional modules for advanced surface texture and form analysis, contour analysis, grains and particles analysis, FFT-based analysis and more.

Dedicated surface imaging, analysis and metrology software for 3D optical microscopes and profilers measuring topography - confocal microscopes, interferometric microscopes, digital holographic microscopes, focus variation microscopes & structured light systems Compatible with all 3D optical profilers and microscopes used for surface analysis and metrology. Real time imaging of 3D surface topography with near-perfect lighting. 3D surface overlays for fast feature location - overlay color and intensity images on 3D topography. Remove data acquisition artifacts - outliers, local defects. Increase field of view virtually - assemble measurements using surface topography stitching. Analyze roughness and surface texture - in accordance with the latest ISO and national standards. Analyze surface geometry - including volume of surface structures (bumps, holes), step heights. Extract and analyze regions of interest - study them in the same way as full measured surfaces. 3D reconstruction of multi-focus images - reconstruct 3D topography from multi-focus image stacks. Easy integration into lab and production environments - export of all numerical results. Easy publication - export analysis documents, pages and individual images up to 1200 dpi. Add optional modules for advanced surface texture analysis, contour analysis, grains and particles analysis, 3D Fourier analysis, image co-localization, statistics and more.