Spectrometers - Import export

FTIR Excellence for Industry, R&D and Science: INVENIO INVENIO is the definitive spectroscopic solution for routine FTIR analysis as well as research and development. It is all you need and so much more: innovative technologies, intelligent design and its new beam path contribute to an unrivalled user experience. Your advantage: •Outstanding signal-to-noise ratio •Broad spectral range (FIR, MIR, NIR and VIS/UV) •Touch-PC with dedicated software for enhanced productivity •MultiTect™: Up to seven automated and software controlled internal detectors •Transit™: parallel availability of two experimental setups •RockSolid™: reliable, well-proven and precise •CenterGlow™ IR source: optimized light flux and durability •Bruker FM: MIR and FIR spectra in one go •Upgradability: retrofit spectral range extensions or time resolved measurements •Multiple beam inputs and outputs •Compact footprint optimized for laboratory benches

Thermogravimetric analysis (TG) follows changes in mass of the sample as a function of temperature and/or time. TG gives characteristic information about the composition of the measured sample, in particular the amounts of the various components and their thermal behavior. In addition, further measurements are possible such as kinetic analysis of thermal decomposition. The identification of gases released directly from the sample or during thermal treatment cannot be performed just by thermal analysis, but coupling a spectroscopic method such as Fourier-Transform-Infrared (FTIR) spectroscopy is an excellent solution. IR spectroscopy is a classical technique, which depends upon the interaction of infrared radiation with the vibrating dipole moments of molecules. It gives, with the exception of homonuclear diatomics and noble gases, a characteristic spectrum for each substance.

The external accessory PMA 50 has been specially developed for Polarization Modulation measurements. It can be adapted to Bruker TENSOR, INVENIO and VERTEX FTIR spectrometers. All optic and electronic components in the PMA 50 module are optimized for the Polarization Modulation. Both linear dichroitic measurement techniques like PM-IRRAS and circular dichroitic experiments like VCD spectroscopy can be realized using this dedicated system. The core of the Polarization Modulation technique is the Photoelastic Modulator (PEM) with a nominal modulation frequency of 42 kHz. With the help of the parallel 24-bit dual-channel data acquisition technology the sum and the difference signals can be collected simultaneously with highest sensitivity. The PMA 50 module exhibits short beam path, and therefore provides optimal S/N ratio and stability.

The CONFOCHECK is a dedicated FTIR system for the investigation of proteins in water. Its specific configuration facilitates a fast data acquisition (ca. 30 sec. per sample) with a high sample throughput controlled by an extremely user-friendly software interface. FTIR Protein Applications Protein quantification Detection of conformational changes Protein dynamics (temperature induced conformational changes) Monitoring of conformational changes during protein aggregation, precipitation and crystallization Determination of the secondary structure Quantification of all kind of solutes in aqueous samples (buffers, excipients, detergents) Typical Applications in Pharma: Pre-formulation and formulation development: Analysis of the influence of the formulation on protein stability Stability studies (stress tests): Influence of pH, temperature, mutation, etc. on the protein stability

SiBrickScan (SBS) is a dedicated at-line system for the FTIR quantification of interstitial Oxygen in complete Silicon ingots, resulting in a concentration profile along the longitudinal axis. Accessing this information without sawing wafers or test samples is a major and cost saving advantage. Get Valuable Information to Check and Optimize Product Quality Knowing the Oxygen gradient of Si ingots enables important conclusions helping e.g. to control and optimize the Silicon crystallization process or to identify batches of bad raw material. Therefore SBS will help to save costs by optimizing product quality and reducing the amount of defective wafers. The random sampling of individual ingots does strongly reduce sample preparation efforts and provides relevant information much earlier.

The IFS 125HR is the ultimate instrument for the high resolution IR spectroscopy Outstanding results in your laboratory In absorption or emission mode, the IFS 125HR can resolve highly complex spectra into discrete lines for recognition and spectral assignment. Outstanding resolution across the entire spectrum Resolved linewidths of < 0.0009cm -1 Broad spectral range: from 5cm -1 in the far-IR to >50,000cm -1 in the UV Double-sided interferogram acquisition (option) Symmetric line shapes - due to high precision optics Easy range change - every experiment can access different sources and detectors without breaking vacuum. A total of 4 sources and 6 detectors can be accessed through each of two different sample compartments

The VERTEX FTIR research spectrometer productline is the culmination of everything Bruker has pioneered and developed in over 40 years. The VERTEX Series is built on a fully upgradeable optics platform that is designed with the utmost flexibility in mind. VERTEX spectrometers share a wide range of features, including an intelligent network for automation, Automatic Component Recognition (ACR), the Plug &amp; Play Ethernet connection and Automatic Accessory Recognition (AAR). VERTEX 70v Bruker's VERTEX 70v FTIR Spectrometer is based on the well-known RockSolid™ interferometer and the ideal entry level systems for Advanced Research applications. The vacuum optics bench provides class leading specifications. VERTEX 80/80v The high-end VERTEX 80 and the VERTEX 80v vacuum FTIR spectrometers are based on the actively aligned UltraScan™ interferometer, which provides PEAK spectral resolution and highest scanning speed.

The LUMOS II offers outstanding visual and spectral data quality with full automation of all measurement modes: transmission, reflection and ATR. For FTIR beginners and experts alike, the LUMOS II is the best solution for infrared microscopy. Bruker's exclusive Focal Plane Array (FPA) detector technology allows you to experience detailed imaging at the maximum speed. This allows you to take full advantage of the vast possibilities offered by FT-IR microscopy. The OPUS IR software provides you with assistance whenever you need it and allows you to glide effortlessly through measurement, evaluation and reporting. Your advantages: • Extremely fast FT-IR imaging (FPA) • High spectral quality and resolution • Brilliant visual images and huge field of view • Fully automated FT-IR microscope • Integrated, piezo-controlled ATR crystal • Software supported measurement and evaluation • Automatic measurement in transmission, reflection and ATR

VERTEX 80v is the gold standard of R&D FTIR spectroscopy regarding performance, sensitivity and flexibility. With the unique verTera THz extension the VERTEX 80v is now the first and only all-in-one system combining the advantages of FTIR and continuous wave THz spectroscopy, gaining access to an extremely broad spectral range and exciting new possibilities. Unique features: • Hybrid spectrometer FTIR/cw THz spectrometer with spectral range up to 3-50000 cm-1 • No cryogenically cooled components required • Unique effective spectral resolution < 0.0007 cm-1 • Unmatched THz performance due to vacuum beam path and optimized THz data processing • Same sample compartment & accessories applicable for FTIR and cw THz • FTIR and THz mode controlled via OPUS software with full data compatibility

The award winning MATRIX-F II FT-NIR spectrometer allows the direct measurement in process reactors and pipelines, leading to a better understanding and control of the process. Accurate in-line results in seconds Multiple components per measurement Non-destructive analysis Optional built-in 6-port multiplexer Direct method transfer Rugged design Ethernet connectivity and industry standard communication protocols

The Bruker Optics` Cryogenic Silicon Analysis System (CryoSAS) is a dedicated all-in-one system for the low temperature (<15K) impurity analysis of Silicon. CryoSAS is optimized for operation in the industrial environment. CryoSAS combines Bruker's high performance FTIR spectrometers with built-in, closed-cycle cryo-cooling technique that does not require any liquid Helium. All CryoSAS components are state-of-the-art, yet utilize proven technologies to accomplish a difficult analysis in the demanding silicon production environment. CryoSAS can be operated at a high level of automation including accurate reporting of the analysis results.

MATRIX-MF is a rugged and a compact spectrometer that can be fiber optically coupled to measure chemical reactions in laboratory and/or process environments. Bruker's MATRIX-MF FTIR spectrometer expands the proven MATRIX series product line utilizing the information rich mid-IR region for use in both laboratory and process environments. The MATRIX-MF is a process ready FTIR spectrometer that is ideal for real-time monitoring and analysis of chemical and biological reactions.

The FTIR spectrometer ALPHA II combines outstanding quality with a small footprint and sets a benchmark in terms of user convenience. With the integrated panel PC and the touch-based operation, FTIR spectroscopy has never been easier. The ALPHA II features a new way to operate an FTIR spectrometer. With the integrated panel PC and the dedicated OPUS-TOUCH user interface it takes only three touches for measurement, evaluation and report generation. OPUS-TOUCH is very intuitive and guides you conveniently through the measurement and evaluation process. Alternatively the ALPHA II can also be operated with an external PC.

Innovative, powerful and easy to operate, this and more is BRAVO the handheld Raman spectrometer from Bruker. BRAVO relies on the proven Bruker combination of innovation and quality and combines latest technologies for an unparalleled performance. The patented fluorescence mitigation using Sequentially Shifted Excitation (SSE™) enables the measurement of a much wider range of materials than ever before using handheld Raman spectrometers. Duo LASER™ excitation with two lasers offers the highest sensitivity in a large spectral range from 300 cm-1 to 3200 cm-1 including the CH-stretching vibrations. Furthermore, BRAVO supports the most efficient and clearly laid-out workflow on a large 7 inch touch screen display. This and many more form the basis of a unique product especially designed for raw material verification of finished products in the pharmaceutical industry.

Some variants of the QMG 700 will be discontinued Jan 31, 2018 Exceeding Detection Limits with Superior Stability and Refined Resolution Rapid advancements in semiconductor manufacturing technology rely on swift and dependable gas analysis solutions. In the fab or in the lab, select the INFICON QMG 700 Analytical Mass Spectrometer to break through detection barriers and propel your process to the next level of innovation. The QMG 700 provides unparalleled performance and adaptability in a modular design. Enhance your competitive edge with the QMG 700, and achieve a superior level of measurement capability. Select from a wide range of ion source, mass filter, and RF power supply options, to tailor your QMG 700 to specific applications. The QMG 700 boasts more than nine decades of dynamic range and ppb detection limits, making it the ideal instrument for ultra high vacuum measurements. QMG 700 provides unit resolution across its entire mass range, and even higher resolution for...

THE STANDARD IN GAS ANALYSIS Excellent Performance and Great Value for General Vacuum Applications As manufacturing technologies advance and quality standards change, the need to understand your process and maintain product quality is more important than ever. Transpector MPS can help you optimize your process by monitoring process conditions, detecting contaminants, and checking for leaks. Transpector MPS offers the robust performance of the Transpector brand of RGA at an excellent value for our customers. Transpector MPS is available in both 100 amu and 200 amu versions, which gives you the flexibility of performing a wide variety of functions including general leak detection, vacuum diagnostics, and hydrocarbon analysis. This versatility makes Transpector MPS the sensor of choice for vacuum furnace, heat treating, and vacuum coating applications. (1) at 10% of peak height (2) during an eight hour period, after a half hour warm up; in FC mode only (3) 256 millisecond dwell time

FAST, FIELD-READY PROCESS MONITORING SYSTEM Performance, Reliability, and Versatility INFICON Transpector CPM has been the market-leading Residual Gas Analyzer (RGA) process monitoring system in the semiconductor industry for over a decade. Now Transpector CPM 3 provides industry leading measurement speed and sensitivity through a field proven pumping and inlet system integrated with a new sensor and electronics. Transpector CPM 3 is the ideal RGA process monitor for new and established semiconductor processes such as ALD, CVD, PVD, and Etch. Transpector CPM 3 provides proven return on investment to our partners through: 1 Ion source pressure reading @ low emission using total pressure lens 2 Total pressure accuracy @ low emission 3 Maximum ion source operating pressure @ low emission 4 2x10 -4 Torr in the ion source will produce about 1x10 -5 Torr in the quadrupole region 5 MDPP at the ion source with EM on and 1s dwell time 6 Mass 40 contribution onto 41 AMU 7 Zero blast...

Process Characterization Software For The Transpector Gas Analysis System With one-click access to the two most popular RGA functions: monitor and leak check modes, FabGuard Explorer provides you with easy to interpret data showing the most frequently monitored gases (hydrogen, water vapor, nitrogen, oxygen, argon, etc.) in a convenient trend display. FabGuard Explorer is Windows® 8 ready, providing comprehensive RGA software with no concerns about operating system compatibility. The single-sensor version of FabGuard Explorer is a cost-effective solution to operating one Transpector ® RGA. With the software’s multi-sensor version, you can control multiple, different types of Transpector RGAs from a single computer. FabGuard Explorer allows for control of both Transpector MPH and Transpector 2 RGAs from the same software. For connecting multiple Transpector MPH sensors, INFICON offers routers and network switches, while the TCA485 Transpector Communications Adapter is used for...

Modular solution for mass spectrometry With the new HiQuad® Neo mass spectrometer, Pfeiffer Vacuum combines high performance, flexibility and simple operation. The HiQuad® Neo can be optimally integrated into your application as a stand-alone device. Depending on the application, we offer the following options: ■ Mass ranges ■ Rod system materials ■ Cable lengths ■ Ion sources ■ Filament materials ■ Interfaces The mass spectrometer achieves an extremely high measuring speed of up to 125 µs/u. It is characterized by maximum sensitivity and a large dynamic range. With the help of the PV MassSpec, the mass spectrometer is particularly easy to operate. These features make the HiQuad® Neo ideal for research and development applications as well as for integration into analysis systems. We will put together the right solution for your application!

TANGO has exactly what users require of an FT-NIR spectrometer suitable for industrial use: robustness, high precision and straightforward operator guidance. • Proven FT-NIR technology by Bruker • Easy-to-use touch screen operation • Automated background management • Robust and precise optics • Direct calibration transfer to and from all Bruker Optics FT-NIR spectrometers Fast measurements for high sample throughput, simultaneous evaluation of different components and an intuitive handling, without need for expertise training: TANGO simplifies the NIR analysis and therefore offers maximum security of the results. It delivers reliable results wherever highest demands are made on raw materials as well as intermediate and finished products and a rapid measurement at low cost must be ensured.

The intuitive, easy-to-use OPUS software controls all data collection and manipulation functions for the MultiRAM. The real-time spectrum display permits software control of the analysis conditions, including optimization of the laser power and the sample position. High Performance Combine advanced digital electronics with Bruker Optics’ high quality optics and you have the ultimate in a high performance FT-Raman system. The heart of the MultiRAM is Bruker Optics’ patented interferometer with gold coated optics and permanent RockSolid alignment, which provides the superb stability and throughput required for demanding emission experiments.

Visually inspect and chemically analyze in a single work step with your DM6 M LIBS materials analysis solution. The integrated laser spectroscopy function delivers the chemical composition of the microstructure that you see in the microscope image – within a second. Speed up your workflow. The LIBS module turns a Leica optical microscope into a 1-step solution that combines visual inspection and chemical analysis right at your workspace. Determine the composition of what you have visually identified within seconds. Use LIBS to perform advanced material analysis 90% faster compared to inspection with SEM/EDS. Surface contamination or coatings can also be easily removed. Chemical mapping and micro-drilling are further analytical steps.

For the identification of larger particles such as plastic bottles, the fiberoptic multiplexed NIR spectrometer KUSTA1.9MPL-24 was developed for this application. Up to 64 tracks can be used for the plastics analysis on a conveyor belt up to 2800mm. High scan rates can be performed of up to 3m/s conveyor belt speeds. Equipment is also available: probe lines and calibration from 500mm up to 2800mm

Already the standard spectrometer configuration allows you to analysis: - automotive parts, such as bolt, nuts, and design parts etc. - electrical components &amp; parts, such as PCB, connectors etc. - jewellery The advanced collimator design and the used cost-effective proportional counter detector enable high speed measurement over a wide thickness range as used in (multi-) layer structures such as automotive parts, electronic parts and components. Furthermore, the following functions realize an easy and efficient measurement: A new autofocus &amp; auto approach function allows to focus automatically and ensure safe and rapid measurement with a greatly enhanced high level of easy operability. Using this function also enables to focus and to measure even if the samples show large variations in height, without adjusting height at same measurement condition. An optional wide view CCD camera allows positioning and multi-point measurement easily over a larger sample area. This spectromet

With this high-end spectrometer the advantages of a fast and precise 50mm2 SDD, a flexible and robust X-Ray excitation and a motorized XYZ-stage can be used to analyse a wide range of samples in fast, reliable and precise measurements. This includes for example (but not restricted to): - solids (like metal alloys, minerals, jewellery, electronic parts [PCB],…) - powders (minerals, ceramics, paint, soil,… ) in a corresponding holder - liquids (oils, solutions, paint, …) in a corresponding holder A Dual CCD camera system with wide view and high-magnification view enables a precise positioning of the sample easily from a big area to investigate exactly to region of interest you want to analyse. With the help of the optical system an easy navigation over the sample is possible and a laser-based auto-focus system ensures correct measurement position. Furthermore a second laser-system prevents collisions. The easy identification of areas containing targeted elements is possible by combi

You can select form three types of FT150 series depending on the required sample applications. The standard spectrometer configuration allows you to analyse (as example): - electrical components, such as PCB, FPC, micro connector, lead frame etc. - chip component electrodes - general analytics for almost all other kind of samples and coating stacks. The types FT150 and FT150L enable especially the measurement of ultra thin coatings, such as Ni/Pd/Au from PCB connectors by polycapillary optics and an improved high-sensitive 50mm2 SDD detector. Two sizes of sample chamber and stage can be selected to accommodate standard (FT150) or large samples (FT150L). The FT150h using the new poly-capillary system enables the precise investigation of Sn and Ni layers in ceramic chip components by a simultaneous measurement, which is very difficult using conventional capillary or collimator optics. All three configurations have in common that the use of polycapillary optics and a high throughput SDD

The use of XRF techniques enables a non-destructive analysis of nearly all kind of samples with almost no pre-processing. Already this basic spectrometer configuration allows you to analyse: - solids (like metal alloys, minerals, jewellery, electronic parts [PCB],…) - powders (minerals, ceramics, paint, soil,… ) in a corresponding holder - liquids (oils, solutions, paint, …) in a corresponding holder with respect to the latest restricted materials guidelines (like RoHS, WEEE, etc.) but also in a more general way to estimate the composition in an element range from Al (13) to U (92). A CCD camera is used to position the sample that only the area of interest is measured – with the use of suitable collimators a minimum spot size of 1mm can be realized. To enhance the measurement speed and analytical performance (energy resolution) the EA1000VX is equipped with a state-of-the-art 50mm2 SDD detector (no liquid Nitrogen needed anymore). This hardware allows you to analyse film thickness