Microelectronics - Import export

powderfree low ion contamination antistatic ideal for microelectronics process

Speed matters in inspection, process control, or defect and failure analysis for the microelectronics and semiconductor industry. The faster you detect a defect, the faster you can react. With a large field of view, the DM3 XL inspection system allows your team to identify defects faster and increase your yield rate. Make use of the 30% increased field of view of the unique macro objective. Additionally, the DM3 XL uses LED illumination for all contrast methods. LED illumination provides a constant color temperature and offers real color imaging at all intensity levels. - Increase your yield - Reliably detect insufficient development at the edge or within the center of a wafer - Detect uneven radial film thickness - True-to-life color imaging at all intensity levels - Reproducible results

AK 150 F (white) Length: 5.91 inch Width: 0.14 inch Extraction force 20.23 lbs Color Allplastik flat cable ties with smooth contact surface, without grooves and apertures, serrations on outer surface, optimum elasticity lengthwise and crossways, space saving, designed with limited tensile strength to protect very thin cable insulation, pull in direction of opening to release again, intended for one-time use. Minimum purchase: 1000 Pcs. · Delivery 20000 Pcs. per box Note for price inquiry

AK 100 R (black) Length: 3.94 inch Diameter: 0.07 inch Extraction force 13.49 lbs Color Allplastik round cable ties with circular cross section, very smooth, fits through console holes larger than 1.8 mm, space-saving, designed with limited tensile strength to protect very small cable insulation, pull in direction of opening to release again, intended for one-time use. Minimum purchase: 1000 Pcs. · Delivery 40000 Pcs. per box Note for price inquiry