Speed matters in inspection, process control, or defect and failure analysis for the microelectronics and semiconductor industry. The faster you detect a defect, the faster you can react. With a large field of view, the DM3 XL inspection system allows your team to identify defects faster and increase your yield rate. Make use of the 30% increased field of view of the unique macro objective. Additionally, the DM3 XL uses LED illumination for all contrast methods. LED illumination provides a constant color temperature and offers real color imaging at all intensity levels. - Increase your yield - Reliably detect insufficient development at the edge or within the center of a wafer - Detect uneven radial film thickness - True-to-life color imaging at all intensity levels - Reproducible results
NOVOSIM
Turkey
Development of rotating components require intensive testing. While the main goal may be reaching durability and life targets,noise , vibration, temperature and other parameters may play an important role for the customer expectations. Therefore, Novosim offers a customizable testing dynamometer which may be used to in the product development of passenger, commercial, heavy duty or even military vehicle components. Software is easy to use and also highly customizable allowing different product lines to be tested under a single system. With the help of regenerative braking, electricity is recovered and loops back to the test system providing efficient operation. Assuming the tests may run about 1 month, the consumption can be an important parameter for cost control. Different types of data can be collected and stored in a database for further comparisons and tracking of the development process. System automatically generates a report which is also customizable.
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