Inspection - Import export

stable granite and iron cast stand with manual z-adjustment high performance stepper motion controller with joystick and serial interface XY Stage GT8, Rotary Stage RT5, Wafer-Chuck WC6 precise xy stage GT8 with 200 x 200 mm stroke rotary stage RT5 with high round- and flat runout below 5 µm wafer-chuck WC6 for 4-12" wafer wafer-chuck with vacuum-fixture for 12", 10", 8", 6" and 4" wafer

Manual, semi- or fully-automatic microscopes for spinneret inspection "Made in Germany" since more than 40 years. high mechanical stability for long term inspection- and, due to that, spinning-quality. excellent optical image quality for fatigue-proof operation half- or fully-automatic inspection in combination with motorized axes improves the efficency and reduces operator influence by using the UHL component system, the Inspection Microscopes can be easily customized and provide simplified maintenance the PM4, PR5, PR7, PR8 and PR9 Inspection icroscopes are providing a direct, alternating view of capillary and counterbore without moving the spinneret several instrument types provide the fast inspection during stage movement with a large field of view with a speed of up to 2300 capillaries per minute

Double sided display of the sharpened blade with a specific angle of view on video monitors.

granite base in portal design incident light tube with lens turret vacuum waferchuck

Inspection and review system for the inspection of samples with a diameter of 12 inches/300mm. Integrated macro mode for four times the field of view of conventional scanning objectives. Top resolution from any angle with the Oblique UV mode (OUV), which combines oblique illumination with UV light. Optimized airflow in the cleanroom due to the integrated LED illumination. With only one touch of a button magnification, illumination and contrast methods can be changed.

Speed matters in inspection, process control, or defect and failure analysis for the microelectronics and semiconductor industry. The faster you detect a defect, the faster you can react. With a large field of view, the DM3 XL inspection system allows your team to identify defects faster and increase your yield rate. Make use of the 30% increased field of view of the unique macro objective. Additionally, the DM3 XL uses LED illumination for all contrast methods. LED illumination provides a constant color temperature and offers real color imaging at all intensity levels. - Increase your yield - Reliably detect insufficient development at the edge or within the center of a wafer - Detect uneven radial film thickness - True-to-life color imaging at all intensity levels - Reproducible results