Magnifying glass - Import export

For the exterior when topped with its pyramid cap, very soberly transparent, the Part Dieu wall lamp is also the accomplice of the Antana and Valentine chandeliers inside. Contemporary, it magnifies the bulb that you will have to choose design.

Straddling the 17th and 18th centuries, the Carnavalet Collection is a faithful interpretation of the French lantern from this period. With refined details, it combines curves and straight lines, magnified in the Giant version. Lantern to be completed with one of our hook-up accessories.

Straddling the 17th and 18th centuries, the Carnavalet Collection is a faithful interpretation of the French lantern from this period. With refined details, it combines curves and straight lines, magnified in the Giant version. Lantern to be completed with one of our hook-up accessories.

Dedicated imaging, analysis and metrology software for scanning 3D surface profilometers using contact or non-contact techniques - including stylus profilers, laser triangulation profilers, confocal point sensor profilers, auto-focus profilers and white light interferometers Compatible with all scanning 3D surface profilometers used for surface analysis and metrology. Real time 3D imaging of surface topography - at any zoom level, angle and height amplification. Correct measurement artifacts - spikes, anomalous scan lines, missing data points, tip impact. Analyze surface geometry - distances, angles, areas, volumes, step heights, coplanarity. Apply advanced roughness/waviness filtering techniques - defined in ISO 16610. Analyze surface texture - in accordance with the latest ISO and national standards, including ISO 25178 and ISO 4287. Extract and analyze sub-surfaces - study them just like full measured surfaces. Increase profilometer vertical range virtually in software - combine measurements made at different heights. Easy integration into lab and production environments - export of all numerical results. Add optional modules for advanced surface texture and form analysis, contour analysis, grains and particles analysis, FFT-based analysis and more.

Dedicated image enhancement, 3D reconstruction and metrology software for scanning electron microscopes (SEM) SEM image colorization made easy - Go from black and white to color effortlessly in just a few clicks. Superfast 3D reconstruction of surface topography in a matter of seconds - from SEM anaglyphs, two successive SEM scans at different tilt angles or four SEM images obtained by a 4 quadrant detector. 3D enhancement for single SEM images. Real-time 3D visualization at any zoom level or angle – SEM image overlays on 3D topography for enhanced rendering. SEM image enhancement and correction – automatic bi-colorization, colored 3D intensity maps, enhanced 3D rendering, configurable lighting and height amplification, gray level drift correction and denoising. Topography measurements - distances, step heights, areas, volumes, dimensioning of profile contours and cross-sections extracted from surfaces. Characterization of surface roughness and texture – advanced roughness/waviness filtering techniques – 2D and 3D parameters from Ra to ISO 25178. Advanced surface analysis of small objects, structures and features – morphology, grains and particle sizes and more. Correlative SEM studies – combine SEM images from different detectors (SE + BSE) – colocalize SEM images and 3D surface data from AFM/SPMs and overlay SEM images on 3D topography.

With Louis XVI, Lum'art signs a great classic of the flamboyant 18th century. Particularly elegant and slender, this lantern is at ease both outdoors and indoors in an environment that suits it, noblesse oblige!