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Dedicated imaging, analysis and metrology software for scanning 3D surface profilometers using contact or non-contact techniques - including stylus profilers, laser triangulation profilers, confocal point sensor profilers, auto-focus profilers and white light interferometers Compatible with all scanning 3D surface profilometers used for surface analysis and metrology. Real time 3D imaging of surface topography - at any zoom level, angle and height amplification. Correct measurement artifacts - spikes, anomalous scan lines, missing data points, tip impact. Analyze surface geometry - distances, angles, areas, volumes, step heights, coplanarity. Apply advanced roughness/waviness filtering techniques - defined in ISO 16610. Analyze surface texture - in accordance with the latest ISO and national standards, including ISO 25178 and ISO 4287. Extract and analyze sub-surfaces - study them just like full measured surfaces. Increase profilometer vertical range virtually in software - combine measurements made at different heights. Easy integration into lab and production environments - export of all numerical results. Add optional modules for advanced surface texture and form analysis, contour analysis, grains and particles analysis, FFT-based analysis and more.

Dedicated image enhancement, 3D reconstruction and metrology software for scanning electron microscopes (SEM) SEM image colorization made easy - Go from black and white to color effortlessly in just a few clicks. Superfast 3D reconstruction of surface topography in a matter of seconds - from SEM anaglyphs, two successive SEM scans at different tilt angles or four SEM images obtained by a 4 quadrant detector. 3D enhancement for single SEM images. Real-time 3D visualization at any zoom level or angle – SEM image overlays on 3D topography for enhanced rendering. SEM image enhancement and correction – automatic bi-colorization, colored 3D intensity maps, enhanced 3D rendering, configurable lighting and height amplification, gray level drift correction and denoising. Topography measurements - distances, step heights, areas, volumes, dimensioning of profile contours and cross-sections extracted from surfaces. Characterization of surface roughness and texture – advanced roughness/waviness filtering techniques – 2D and 3D parameters from Ra to ISO 25178. Advanced surface analysis of small objects, structures and features – morphology, grains and particle sizes and more. Correlative SEM studies – combine SEM images from different detectors (SE + BSE) – colocalize SEM images and 3D surface data from AFM/SPMs and overlay SEM images on 3D topography.