3d images - Import export

Dedicated image enhancement, 3D reconstruction and metrology software for scanning electron microscopes (SEM) SEM image colorization made easy - Go from black and white to color effortlessly in just a few clicks. Superfast 3D reconstruction of surface topography in a matter of seconds - from SEM anaglyphs, two successive SEM scans at different tilt angles or four SEM images obtained by a 4 quadrant detector. 3D enhancement for single SEM images. Real-time 3D visualization at any zoom level or angle – SEM image overlays on 3D topography for enhanced rendering. SEM image enhancement and correction – automatic bi-colorization, colored 3D intensity maps, enhanced 3D rendering, configurable lighting and height amplification, gray level drift correction and denoising. Topography measurements - distances, step heights, areas, volumes, dimensioning of profile contours and cross-sections extracted from surfaces. Characterization of surface roughness and texture – advanced roughness/waviness filtering techniques – 2D and 3D parameters from Ra to ISO 25178. Advanced surface analysis of small objects, structures and features – morphology, grains and particle sizes and more. Correlative SEM studies – combine SEM images from different detectors (SE + BSE) – colocalize SEM images and 3D surface data from AFM/SPMs and overlay SEM images on 3D topography.

Dedicated imaging, analysis and metrology software for scanning 3D surface profilometers using contact or non-contact techniques - including stylus profilers, laser triangulation profilers, confocal point sensor profilers, auto-focus profilers and white light interferometers Compatible with all scanning 3D surface profilometers used for surface analysis and metrology. Real time 3D imaging of surface topography - at any zoom level, angle and height amplification. Correct measurement artifacts - spikes, anomalous scan lines, missing data points, tip impact. Analyze surface geometry - distances, angles, areas, volumes, step heights, coplanarity. Apply advanced roughness/waviness filtering techniques - defined in ISO 16610. Analyze surface texture - in accordance with the latest ISO and national standards, including ISO 25178 and ISO 4287. Extract and analyze sub-surfaces - study them just like full measured surfaces. Increase profilometer vertical range virtually in software - combine measurements made at different heights. Easy integration into lab and production environments - export of all numerical results. Add optional modules for advanced surface texture and form analysis, contour analysis, grains and particles analysis, FFT-based analysis and more.

Dedicated surface imaging, analysis and metrology software for 3D optical microscopes and profilers measuring topography - confocal microscopes, interferometric microscopes, digital holographic microscopes, focus variation microscopes & structured light systems Compatible with all 3D optical profilers and microscopes used for surface analysis and metrology. Real time imaging of 3D surface topography with near-perfect lighting. 3D surface overlays for fast feature location - overlay color and intensity images on 3D topography. Remove data acquisition artifacts - outliers, local defects. Increase field of view virtually - assemble measurements using surface topography stitching. Analyze roughness and surface texture - in accordance with the latest ISO and national standards. Analyze surface geometry - including volume of surface structures (bumps, holes), step heights. Extract and analyze regions of interest - study them in the same way as full measured surfaces. 3D reconstruction of multi-focus images - reconstruct 3D topography from multi-focus image stacks. Easy integration into lab and production environments - export of all numerical results. Easy publication - export analysis documents, pages and individual images up to 1200 dpi. Add optional modules for advanced surface texture analysis, contour analysis, grains and particles analysis, 3D Fourier analysis, image co-localization, statistics and more.

Dedicated image analysis software for optical microscopes and laboratory images MountainsMap® Image software makes it possible to: Add dimensions to your images and turn them into metrology data. Extract horizontal contours for geometric dimensioning. Quantify binary, grayscale and color-shaded spots, grains and particles. Enhance image quality and remove defects. Convert color images into 3D for better understanding of color variation. Link images with other types of surface data handled by Mountains®.

Dedicated Scanning Probe Microscope imaging, analysis and metrology software (SPM, AFM, STM, CSAFM, KPFM, MFM, NSOM, etc.) Compatible with all scanning probe microscope techniques for nano surface imaging and analysis. Real time 3D multi-channel imaging of SPM topography, phase, defection, current, auxiliary and other layers including overlays. High quality SPM imaging with powerful image optimization and enhancement tools. Intelligent SPM image artifact correction, scan line by line leveling, noise filtering. Comprehensive nano surface analysis including nano-geometry and roughness. Numerous optional modules including AFM force curve analysis and colocalization of SPM images with SEM and other images. Smart user interface for maximum ease of use combined with powerful automation features - including multiple topography image stitching - to accelerate analysis. Easy integration into research and lab environments including export of numerical data and images for easy post-processing and publication.