ufs.country_names.RU, Moscow
...NIOS series modular design allows end-users to configure nanomechanical tester specifically for their needs and requirements. Configurations of NIOS nanomechanical tester can consist of following modules: - Widerange nanoindenter - Optical Microscope - Atomic Force Microscope - Scanning nanomechanical tester - Electrical Properties Measurement - Lateral Force Sensor - Insitu Topography...
ufs.country_names.RU, Moscow
... of XY amplifiers:1.5 mA Maximal current of Z amplifiers:8 mA Integrated demodulator for X,Y,Z capacitive capacitance sensors:Yes Open/Closed-loop mode for X,Y controlх:Yes Generator frequency setting range:DC – 5 MHz Deflection registration channel bandwidth:170 Hz - 5 MHz Lateral Force registration channel bandwidth:170 Hz - 5 MHz 2 additional registration channel bandwidth:170 Hz - 5 MHz Bias...

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