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IMOS Interference Microscope-nanoprofilometer enables accurate, quantitative, ISOcompliant noncontact surface measurements and characterization of micro and nanoscale surface characteristics, capturing up to two million data points in seconds. Choosing the right optical profilometer depends on your application requirements, including speed, accuracy, vertical range, automation and flexibility. IMOS optical surface profilometer provides powerful versatility in noncontact optical surface measurements. The system makes it easy and fast to investigate a wide range of surface types, including smooth, rough, flat, sloped and stepped surfaces. All measurements are nondestructive, fast and require no special sample preparation.
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