Sampling systems - Import export

GAOS MS mass spectrometers provide fast, accurate, and comprehensive gas analysis in real-time. Operational characteristics: - Modular configuration, quick replacement of units for maintenance and repair; - Protective performance according to customer requirements; - Continuous operation 24 hours for 6 to 12 months without servicing the vacuum system; - Automatic algorithm of work with functions of diagnostics, adjustment, calibration and operational control of measurement accuracy. Depending on analytical applications, GAOS MS process mass spectrometers are equipped with various modifications of the sample preparation system. Continuous sampling of the gas probe under conditions: - Temperature up to 1200 °C; - Dust content up to 30 g/m3; - Pressure (10-3÷3) bar; - Presence of condensate, aggressive gases;

Application areas: - health care - drug discovery - pharmacy - environmental monitoring - forensic science - homeland security Technical performance: - patented design is a combination of a multifunctional sample introduction and ionization system, drift tube ion mobility spectrometer and sector TOF mass spectrometer with orthogonal acceleration - Multifunction sample introduction and ionization system works with both integrated ion sources and external available engineering solutions. Integrated ionization platform allows to use electrospray (ESI), atmosphere pressure chemical ionization (APCI), atmosphere pressure photoionization (APPI) - high resolution ion mobility spectrometer provides maximum selectivity compared to existing commercial instruments Main advantages: - allows to reach better sensitivity than approaches based on orthogonal acceleration reflectron TOF analyzers - allows to analyze gases and liquids much faster than liquid chromatography/mass spectrometry

Scanning Thermal Microscopy (SThM) is an advanced SPM mode intended for simultaneous obtaining nanoscale thermal and topography images. NTMDT’s SThM kit is able to visualize temperature and thermal conductivity distribution at the sample surface. The SThM system hardware includes electronic controller, software, and probes. SThM mode of operation with an AFM requires a specialized probe with a resistor built into the cantilever. NTMDT’s SThM module allows one to monitor the resistance changes correlated with the temperature at the end of the probe. So the system is able to monitor relative changes of sample temperature and thermal conductivity. NTMDT’s thermal probes provide better than 100 nm lateral resolution for both topography and thermal images. The specialized SThM cantilever, made of SiO2 with a thin metal layer, is deposited on the probe in such a way that the highest resistance portion of the layer is concentrated near the tip apex.

IR s‑SNOM microscopy and spectroscopy with 10 nm spatial resolution Wide spectral range of operation 312 μm Incredibly low thermal drift and high signal stability Versatile AFM with advanced modes SRI (conductivity), KPFM (surface potential), SCM (capacitance), MFM (magnetic properties), PFM (piezoelectric forces) HybriD Mode™ quantitative nanomechanical mapping Integration with microRaman (optional) The ability of s‑SNOM measurements in the visible spectral range (optional) NTMDT Spectrum Instruments presents NTEGRA Nano IR scattering scanning nearfield optical microscope (s‑SNOM) designed for infrared (IR) spectral range. AFM probe is located in the focus of optical system which excites sample structure by IR laser and collects the optical response. Collected light is directed to Michelson interferometer for optical analysis.