Process analysis - Import export

Applications: - Real-time A-scan & A-scan Capture - B-scan & SLICE - Threshold Mapping (post-processing) - Frequency Domain Imaging (FFT) - C-scan with Multi-gate SALI & SALI Groups - Cluster Analysis (post processing) - Advanced Time-of-Flight & Thickness Measurements - Scan Math Before and After Reflow Characterization - 3D Imaging - Void Gating (real-time) Available modes: - A-Scan - Patch Scan - Top Scan - Counterfeit Detection - B-Scan - Focus B - Sub B - Cross B - C-Scan - Dual Gate - SALI - SALI Groups - TX-Scan - Concurrent PE/TX - D-Scan - 3D