Optical microscopes - Import export

The magnetic system of this field source is also built on the principle of nested cylindrical Halbach-structures. An important feature is the presence of two motors, controlled independently, so it is possible to manage the change not only the magnitude but also the direction of the magnetic field. Because the device was designed for operation together with an optical microscope, the vertical size of the system near the working region is reduced to 90 mm. Stepper motors, that turn the two magnetic subsystems, are located on the sides of the casing

IMOS Interference Microscope-nanoprofilometer enables accurate, quantitative, ISOcompliant noncontact surface measurements and characterization of micro and nanoscale surface characteristics, capturing up to two million data points in seconds. Choosing the right optical profilometer depends on your application requirements, including speed, accuracy, vertical range, automation and flexibility. IMOS optical surface profilometer provides powerful versatility in noncontact optical surface measurements. The system makes it easy and fast to investigate a wide range of surface types, including smooth, rough, flat, sloped and stepped surfaces. All measurements are nondestructive, fast and require no special sample preparation.

Industry leading automation level Outstanding noise floor and thermal drifts Fast scanner with XYZ lownoise closeloop Routine atomic resolution 60+ SPM modes in basic configuration Continuous zoom from millimeter to nanometer range Integrated with new Atomic Force Microscopy technique HybriD Mode™ Atomic Force Microscope NEXT provides motorized sample positioning and integrated high resolution optical microscope positioning, motorized continuous zoom and focusing of the optical microscope. But AFM automation is more than just motorization. Powerful Nova PX software algorithms remove a gap between optics and AFM providing continuous zoom from huge panoramic optical view down to atomic resolution. Since all step movers are coupled together with the optical image, NEXT provides autofocus, fast oneclick cantilever alignment, panoramic optical view and multiple scanning on 5×5 mm range.Cantilever recognition and automatic laser alignment both in liquid and air Autofocus

IR s‑SNOM microscopy and spectroscopy with 10 nm spatial resolution Wide spectral range of operation 312 μm Incredibly low thermal drift and high signal stability Versatile AFM with advanced modes SRI (conductivity), KPFM (surface potential), SCM (capacitance), MFM (magnetic properties), PFM (piezoelectric forces) HybriD Mode™ quantitative nanomechanical mapping Integration with microRaman (optional) The ability of s‑SNOM measurements in the visible spectral range (optional) NTMDT Spectrum Instruments presents NTEGRA Nano IR scattering scanning nearfield optical microscope (s‑SNOM) designed for infrared (IR) spectral range. AFM probe is located in the focus of optical system which excites sample structure by IR laser and collects the optical response. Collected light is directed to Michelson interferometer for optical analysis.

RAMOS S120 compact dual-channel confocal Raman microscope is designed for micro spectral measurements with capabilities at the level of high-end systems. RAMOS S120 microscope has a rigid, moving parts free design that requires no adjustments, has both high sensitivity and high spatial resolution, and can be equipped with two single-mode lasers simultaneously, 488/633 nm or 532/785 nm. Wide possibilities, high reliability, and compactness allow using RAMOS S120 for solving a wide range of scientific and industrial applications. Main features: - Research level optical microscope with advanced measurement techniques - Submicron resolution due to confocal design - One or two integrated single-mode lasers - Fully automated change of lasers/gratings without additional system alignment - Automatic adjustment of laser power - Wide dynamic range and extremely high sensitivity of innovative sCMOS detector - Fiber optic Raman probe option - Raman mapping with motorized sample stage

RAMOS U120 compact single-channel confocal Raman microscope is designed for micro spectral measurements with capabilities at the level of high-end systems. RAMOS U120 microscope has a rigid, moving parts free design that requires no adjustments, has both high sensitivity and high spatial resolution. A wide range of capabilities, high reliability, and compact size allow using RAMOS U120 for various scientific and industrial applications. Main features: - Research level optical microscope with advanced measurement techniques - Submicron resolution due to confocal design - Automatic adjustment of laser power - Wide dynamic range and extremely high sensitivity of innovative sCMOS detector - Edge or Notch filters for Stokes and AntiStokes spectroscopy - Automatic switching between Raman, optical and combined Raman-optical modes - Fiber optic Raman probe option - Raman mapping with motorized sample stage - Laser Safety Class 3B

NIOS series modular design allows end-users to configure nanomechanical tester specifically for their needs and requirements. Configurations of NIOS nanomechanical tester can consist of following modules: - Widerange nanoindenter - Optical Microscope - Atomic Force Microscope - Scanning nanomechanical tester - Electrical Properties Measurement - Lateral Force Sensor - Insitu Topography Imaging - Heating Stage NIOS Advanced is the flagship model that implements more than 30 different measuring techniques covering all types of physical and mechanical properties measurements at the submicron and nanometer scale. With NIOS control software high degree of automated measurements can be achieved allowing end-user to configure any set of measurement recipes to be performed without operator intervention. This feature is particularly useful for technical control of materials quality. With this added functionality, NIOS can be used for research and for industrial applications.

Rebirth of Force Spectroscopy Advanced Nanomechanical, Electrical, Optical, Thermal and Piezoresponse Studies Fast Quantitative Nanomechanical Measurements and Force Volume Simultaneous Electrostatic and Nondestructive Conductivity, Piezoresponse and Thermal Studies Advanced CantileverType TipEnhanced Raman Scattering and Scanning NearField Optical Microscopy Topography in Attraction and Repulsive Regimes Young’s Modulus and Force Volume Adhesion and Work of Adhesion Conductivity InPlane and OutofPlane Piezoresponse Temperature and Thermal Conductivity Thermoelectric Electrostatic Kelvin Probe Force, Electrostatic Force and Scanning Capacitance Force Microscopy NearField Component of Optical Response TipEnhanced Raman Scattering In HybriD mode the tipsample distance is modulated according to the quasiharmonic law.