Imaging optics - Import export

RAMOS E/M series Raman spectrometers are designed on the basis of research-grade optical microscopes allowing the realization of the following light microscopy methods: - Raman measurements - Transmitted light - Reflected light (bright field and dark field illumination) - Confocal microscopy - Fluorescence measurements - Polarization contrast and phase-contrast imaging - Differential interference contrast 3D scanning laser Raman microscopes provide rapid, high sensitivity analysis. The innovative approach to system design of Raman spectrometers ensures extremely high temperature and temporal stability of spectral measurements. All RAMOS E200 system components are fully integrated within an optical microscope providing compactness and mobility of the system. In RAMOS M350, M520, M750 systems external imaging spectrographs are connected via optical fibers. Raman measurements with the RAMOS E/M Series systems can be started in several minutes by turning a system key.

Industry leading automation level Outstanding noise floor and thermal drifts Fast scanner with XYZ lownoise closeloop Routine atomic resolution 60+ SPM modes in basic configuration Continuous zoom from millimeter to nanometer range Integrated with new Atomic Force Microscopy technique HybriD Mode™ Atomic Force Microscope NEXT provides motorized sample positioning and integrated high resolution optical microscope positioning, motorized continuous zoom and focusing of the optical microscope. But AFM automation is more than just motorization. Powerful Nova PX software algorithms remove a gap between optics and AFM providing continuous zoom from huge panoramic optical view down to atomic resolution. Since all step movers are coupled together with the optical image, NEXT provides autofocus, fast oneclick cantilever alignment, panoramic optical view and multiple scanning on 5×5 mm range.Cantilever recognition and automatic laser alignment both in liquid and air Autofocus