Terahertz - Import export

VERTEX 80v is the gold standard of R&D FTIR spectroscopy regarding performance, sensitivity and flexibility. With the unique verTera THz extension the VERTEX 80v is now the first and only all-in-one system combining the advantages of FTIR and continuous wave THz spectroscopy, gaining access to an extremely broad spectral range and exciting new possibilities. Unique features: • Hybrid spectrometer FTIR/cw THz spectrometer with spectral range up to 3-50000 cm-1 • No cryogenically cooled components required • Unique effective spectral resolution < 0.0007 cm-1 • Unmatched THz performance due to vacuum beam path and optimized THz data processing • Same sample compartment & accessories applicable for FTIR and cw THz • FTIR and THz mode controlled via OPUS software with full data compatibility

Pulsed terahertz generation with leading-edge technology: InGaAs antennas provide about 30 µW power and a bandwidth of 6 THz. The emitter and detector modules, developed by Fraunhofer Heinrich-Hertz Institute (Berlin/Germany), feature a strip-line and a dipole antenna, respectively, and are packaged with a Silicon lens and SM/PM fiber. They make up the core component of TOPTICA’s TeraFlash pro and TeraFlash smart, but are available as individual modules too.

The TeraSpeed serves applications in quality control and process monitoring that require no spectral information, but call for terahertz intensity measurements at “extreme” speeds: the system is capable of detecting individual terahertz pulses at repetition rates as high as 100 MHz. An integrated data-processing unit converts the detected pulses to RMS values, enabling data streams at sampling rates up to 500 kHz – orders of magnitude faster than conventional terahertz systems. Bringing together several cutting-edge technologies, the TeraSpeed takes advantage of mature fiber laser technology, powerful photoconductive emitters and fast yet sensitive Schottky receivers.

TOPTICA’s TeraFlash smart utilizes a proprietary scheme dubbed ECOPS ("electronically controlled optical sampling"). The system comprises two synchronized femtosecond lasers, eliminating the need for a mechanical delay. This results in extremely high measurement speeds: the TeraFlash smart acquires 1600 complete terahertz waveforms per second, enabling terahertz-based thickness gauging at unprecedented speed. The system thus lends itself to measurements on rapidly moving samples, e.g. conveyor belts, papermaking machines, or extrusion lines. Learn more about TOPTICA's advanced terahertz solutions.

An accessory to the TeraFlash pro, the Imaging Extension utilizes two precise linear stages to scan a sample through the focus of the terahertz beam. The translational movement is synchronized with the shaker of the TeraFlash pro, resulting in a high measurement speed of up to 16 pixel/sec. A “basic” setup is available for researchers who wish to use their own optical components, and a “complete” version includes parabolic mirrors for beam shaping and focusing.

Having teamed up with some of the leading terahertz research institutes, TOPTICA is able to provide top-quality GaAs and InGaAs photomixers. Both material systems offer an excellent bandwidth and dynamic range. The modules come equipped with a Silicon lens and SM/PM fiber pigtail. The all-fiber design eliminates the need for time-consuming laser beam alignment, and enables an easy and flexible integration into any terahertz assembly.

cw terahertz spectroscopy based on photomixing offers the attractive feature of detecting both amplitude and phase of the terahertz wave. Determining the phase requires a modulation of the optical path length, or the terahertz frequency. The Phase Modulation Package offers a particularly fast and accurate technique to scan the terahertz phase, by using a symmetric setup with two fiber stretchers wound around piezo actuators. Users can thus retrieve full information on phase and amplitude of the terahertz wave - with single-Megahertz resolution!

TOPTICA is been able to push the frequency limits of frequency-domain spectrometers. Whilst one DFB laser at 1.5 µm offers a tuning range of approximately 600 GHz, a combination of three lasers covers the entire range from DC to 2.0 THz, or – using more elaborate combinations – even up to 2.7 THz. TOPTICA’s “Tuning Range Extension” thus provides access to frequencies that used to be beyond reach with commercial frequency-domain spectrometers.

Each TeraBeam system comprises two distributed feedback (DFB) lasers with built-in optical isolators and fiber-optic beam combination. Available at 780 nm and 1.5 µm, the TeraBeam matches the excitation wavelengths of GaAs and InGaAs terahertz emitters, respectively. TOPTICA carefully selects the laser diodes with respect to their thermal tuning range. The DLC Smart controls the temperatures of both lasers with unmatched precision.

TOPTICA’s TeraScan platforms are well-established “TopSeller” configurations for frequency-domain terahertz spectroscopy. The systems combine mature DFB diode lasers with state-of-the-art GaAs or InGaAs photomixers. The TeraScan 780 offers an outstanding bandwidth, and the TeraScan 1550 sets new benchmarks in terms of terahertz power and dynamic range. Both systems feature TOPTICA's proprietary “DLC smart” control electronics.

The QUANTUM 360 has a terahertz sensor that reverses along the pipe to be measured. The coverage corresponds to a full 360° over the entire circumference of the pipe. This allows a very accurate overview of all process parameters. After selecting the pipe recipe, the QUANTUM 360 detects the pipe position, centers itself automatically to the pipe via a cross table and the sensor is automatically moved into focus. When changing dimensions, only a change of the pipe recipe is required. Due to the high measuring frequency, wall thickness, diameter and multi-layer measurements are possible with layer thicknesses from 100 μm. Other advantages/features: — Detailed product information (wall thickness, diameter, eccentricity, ovality) — Process automation through proven control principles — Non-contact measurement, no seals required — Material savings of up to 5% — Coextrusion measurement