Spectroscopes - Import export

The NARVA 55147 is a high-precision special lamp produced in Germany by the lamp manufacturer vosla GmbH. It is representative of a wide range of high-quality, finely adjusted special base lamps for microscopes and similar high-precision medical technology. Our lamps meet the highest production standards. Precision in the positioning of the filament and the carrier plate is essential, especially for microscope lamps.

The NARVA 54201 is a high-precision, special reflector lamp produced in Germany by the lamp manufacturer vosla GmbH. It is representative of a wide range of reflector lamps for medical and analytical equipment and for use in optical measuring instruments (spectrometers, photometers, etc.). The highest standards of accuracy and quality are required in laboratory equipment for analysis, such as spectroscopes and fiber optic measurements.

The NARVA 55917 is a high-precision special lamp produced in Germany by the lamp manufacturer vosla GmbH. It is representative of a wide range of high-quality pin base lamps for medical and analytical equipment such as microscopes and analyzers for blood and water samples. Furthermore, special lamps such as these are used in optical measuring instruments (spectrometers, photometers, etc.). NARVA lamps meet the strictest quality criteria in the medical sector. This means that they can be used in operating theaters, in medical devices and in diagnostics.

The RAM II is the first dual channel FT-Raman module that can be coupled to the VERTEX FT-IR research spectrometer series. Utilizing the input and output port of an INVENIO, VERTEX 80 or the related vacuum versions VERTEX 70v und VERTERX 80v the RAM II provides the ideal FT-Raman measurement device. The intuitive, easy-to-use OPUS software controls all data collection and manipulation functions for the system and allows automated switching between FT-Raman and FT-IR measurements.

LIOS 500N is a modern powerful instrument that incorporates innovative technologies in spectroscopy, lasers, and software enabling unique measurements of chemical elements in a sample as well as 2D, 3D elemental mapping, and in-depth profiling. The most convenient and efficient analytical technique of choice for a wide range of applications. Main advantages: - Universality (no need to restart the instrument while analyzing different materials) - Easy and fast analysis (little to no sample preparation) - Highest analytical flexibility (variations in a sample shape and size may be infinite) - High-Speed Analysis - Wide range of concentrations (from ppm to tens of percent) - High accuracy measurements and stability - Low cost of a single analysis, minimum consumables The optical layout offers the ability to make analysis of chemical composition in a small area of inhomogeneous samples, provides elemental mapping and layer-by-layer analysis.

Force spectroscopy is a wellknown AFM technique for quantification of local nanomechanical properties. HD mode allows fast, more than 1000 force curves per second measurements, realtime calculation of Young’s modulus according to Hertz, DMT, JKR and other mathematical models and automated cantilever force constant calibration. HybriD Mode uniquely enables stiff materials to be distinguished from each other by means of an AFM probe. Areas corresponding to Bismuth (32 GPa, blue color) and Tin (50 GPa, yellow color) are clearly identified. The mechanical properties map corresponds well with the surface potential image.