Sem - Import export

TECHNICAL DEFINITION Ultra-light ready mixed filler for repair of interior or exterior walls and ceilings. Shrink free and fast drying, SEM-LIGHT is ideal for high quality filling jobs and is very ease to use. COMPOSITION AND APPEARANCE Resins in emulsion with lightening agents and various additives. The paste is snow white. ACCEPTED SUBSTRATES Interior and exterior walls and ceilings • Plaster • Masonry • Cellular concrete • Concrete • Plasterboard • Roughcast • Wood • Cement render TECHNICAL CHARACTERISTICS • Density : 0.4 • pH : 7 • Shrink-free filling • Excellent application qualities STORAGE 12 months in unopened original packing protected from frost and extreme heat. PREPARATION OF SURFACES BEFORE APPLICATION The substrates must be clean, free of dust and any trace of formwork release oil. Indoors, during hot weather or on absorbent substrates the surfaces may be dampened slightly. Cracks should be opened up before application.

by combining multiple parts such as a captive washer and screw into a single versatile fastener, KEBA SEMS screws provide efficiencies both in design and manufacturing.

The Leica EM TRIM2 is a high speed milling system with integrated stereomicroscope and LED ring illuminator for trimming of biological and industrial samples prior to ultramicrotomy.

The microPREP™ PRO system was developed to provide efficient laser sample preparation fitted to the needs of microstructure diagnostics and failure diagnostics. Therefore, with microPREP™ PRO material samples can be prepared effectively and economically by using an ultrashort pulse laser. microPREP™ PRO allows to create complex and 3D-shaped samples to enable more comprehensive analysis of certain structures like in advanced packages, such as through silicon vias (TSVs), or even complete systemsinpackage (SiP). Furthermore, it is ideal to provide larger sized samples with microlevel precision. The integrated overview camera assists in navigating on larger samples – the high definition process camera allows for exact positioning. Moreover, the application of a picosecond laser ensures virtually no structural damage and no elemental contamination of the material.

Dedicated image enhancement, 3D reconstruction and metrology software for scanning electron microscopes (SEM) SEM image colorization made easy - Go from black and white to color effortlessly in just a few clicks. Superfast 3D reconstruction of surface topography in a matter of seconds - from SEM anaglyphs, two successive SEM scans at different tilt angles or four SEM images obtained by a 4 quadrant detector. 3D enhancement for single SEM images. Real-time 3D visualization at any zoom level or angle – SEM image overlays on 3D topography for enhanced rendering. SEM image enhancement and correction – automatic bi-colorization, colored 3D intensity maps, enhanced 3D rendering, configurable lighting and height amplification, gray level drift correction and denoising. Topography measurements - distances, step heights, areas, volumes, dimensioning of profile contours and cross-sections extracted from surfaces. Characterization of surface roughness and texture – advanced roughness/waviness filtering techniques – 2D and 3D parameters from Ra to ISO 25178. Advanced surface analysis of small objects, structures and features – morphology, grains and particle sizes and more. Correlative SEM studies – combine SEM images from different detectors (SE + BSE) – colocalize SEM images and 3D surface data from AFM/SPMs and overlay SEM images on 3D topography.