Microscopes - Import export

The SENTERRA II defines a new level of spectroscopic performance and user friendliness in the class of compact Raman microscopes. SENTERRA II is designed to deliver excellent sensitivity combined with high spectral and imaging performance. Therefore the SENTERRA II is a powerful platform for advanced research applications. Due to its high degree of automation, compact size and efficient workflow the SENTERRA II is likewise an ideal tool for solving real world tasks in the quality control laboratory. Its unprecedented permanent stability of the wavenumber axis guarantees precise and accurate results at every time. The SENTERRA II is THE Raman microscope for both, the multi-user environment with high daily throughput and for the lab working at the forefront of scientific research.

The RAM II is the first dual channel FT-Raman module that can be coupled to the VERTEX FT-IR research spectrometer series. Utilizing the input and output port of an INVENIO, VERTEX 80 or the related vacuum versions VERTEX 70v und VERTERX 80v the RAM II provides the ideal FT-Raman measurement device. The intuitive, easy-to-use OPUS software controls all data collection and manipulation functions for the system and allows automated switching between FT-Raman and FT-IR measurements.

The HYPERION II microscope combines FT-IR and infrared laser imaging (ILIM) microscopy in a single instrument for the first time. It offers all three measurement modes: transmission, reflection and ATR. Now, users have the unique opportunity to use an IR microscope that offers both, the reliability and precision of FT-IR and the tremendous speed advantage of IR laser imaging, all in one.

The LUMOS II offers outstanding visual and spectral data quality with full automation of all measurement modes: transmission, reflection and ATR. For FTIR beginners and experts alike, the LUMOS II is the best solution for infrared microscopy. Bruker's exclusive Focal Plane Array (FPA) detector technology allows you to experience detailed imaging at the maximum speed. This allows you to take full advantage of the vast possibilities offered by FT-IR microscopy. The OPUS IR software provides you with assistance whenever you need it and allows you to glide effortlessly through measurement, evaluation and reporting. Your advantages: • Extremely fast FT-IR imaging (FPA) • High spectral quality and resolution • Brilliant visual images and huge field of view • Fully automated FT-IR microscope • Integrated, piezo-controlled ATR crystal • Software supported measurement and evaluation • Automatic measurement in transmission, reflection and ATR