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Germany
We offer you all common analytical techniques for quantitative and semi-quantitative XRF, X-ray fluorescence analysis of various materials on up to 71 elements of solids. Fast and reliable analyses with high precision and accuracy down to the trace element range, on request as an immediate service – accredited test procedures – Wide element range up to 71 elements from fluorine to uranium in one measurement run, suitable for product and raw material monitoring or analysis of unknown materials –Various preparation techniques such as melt fusion, powder compaction, non-destructive measurements
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The application possibilities of the scanning electron microscope, SEM in combination with the energy dispersive X-ray microanalysis, EDX are manifold. The areas of application listed here are only examples of some of the applications. Many other questions can be clarified with our microtextural and microanalytical test methods. Our services for you: X-ray microanalysis, EDX element mappings, line scans, SEM imaging, particle size determination, fiber thickness measurement, damage assessment
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