Measuring station - Import export

All NanoTest stations combines precise measurements with high speed, proven reliability and ease of use. The versatility qualifies the stations not only for high volume quality assurance, but also for demanding development applications. This qualification helps to differentiate well-working devices from the ones with mediocre performance. In this way, unnecessary processing of low-quality devices is avoided early and possible problems during wafer production will be determined. NanoTest-W characterizes the optical and electrical behavior of VCSEL or Silicon Photonics chips on wafer level, while NanoTest-C is used for laser diodes, receivers and passive devices on bar or chip level.

The CoMeT system is used to measure the screening effectiveness (transfer impedance, screening attenuation and coupling attenuation) of coaxial and symmetrical cables, connectors, bushings, distribution components, etc. The original CoMeT (Coupling Measuring Tube) has grown into a complete system. In principle, a cable measuring station consists of the following basic components: In addition to differently dimensioned round tube systems for cables and connectors, there are also so-called “triaxial cells” that provide a larger measuring chamber volume for parts that do not fit into one of the tubes due to their geometry (sockets, distributors, etc.).