Electronic microscopes - Import export

The application possibilities of the scanning electron microscope, SEM in combination with the energy dispersive X-ray microanalysis, EDX are manifold. The areas of application listed here are only examples of some of the applications. Many other questions can be clarified with our microtextural and microanalytical test methods. Our services for you: X-ray microanalysis, EDX element mappings, line scans, SEM imaging, particle size determination, fiber thickness measurement, damage assessment

The ZHN/SEM is a complete nanoindenter specifically designed for use in the confined spaces of the vacuum chamber of a scanning electron microscope (SEM).