Electron microscopy - Import export

The application possibilities of the scanning electron microscope, SEM in combination with the energy dispersive X-ray microanalysis, EDX are manifold. The areas of application listed here are only examples of some of the applications. Many other questions can be clarified with our microtextural and microanalytical test methods. Our services for you: X-ray microanalysis, EDX element mappings, line scans, SEM imaging, particle size determination, fiber thickness measurement, damage assessment

Single-stage rotary vane pumps from Pfeiffer Vacuum have long been some of the most widely used products for processes in the low and medium vacuum range. Their long life and pumping speed, irrespective of the gas used, are the outstanding properties of this pump. Typical applications are found in widely ranging sectors: — Analytics (mass spectrometry, electron microscopy) — Coating technology (surface protection, decorative films, display units, monitor screens) — Vacuum metallurgy (vacuum soldering, vacuum sintering, vacuum alloys, furnace construction) — Leak detection technology (vacuum systems, automotive tanks, airbag cartridges, packaging) — Lighting industry (light bulb manufacture) — Drying industry (vacuum drying, transformer drying)

The Triple Ion Beam Milling System, Leica EM TIC 3X allows production of cross sections and planed surfaces for Scanning Electron Microscopy (SEM), Microstructure Analysis (EDS, WDS, Auger, EBSD) and, AFM investigations. With the Leica EM TIC 3X you achieve high quality surfaces of almost any material at room temperature or cryo, revealing the internal structures of the sample in a near native state as possible.

High quality sectioning of specimens for light, electron, and atomic force microscopy examination has never been easier and more precise. Leica Microsystems introduces its latest specimen preparation technology: the Leica EM UC7 ultramicrotome and the Leica EM FC7 cryo chamber attachment.