Surface roughness - Import export

Dedicated image enhancement, 3D reconstruction and metrology software for scanning electron microscopes (SEM) SEM image colorization made easy - Go from black and white to color effortlessly in just a few clicks. Superfast 3D reconstruction of surface topography in a matter of seconds - from SEM anaglyphs, two successive SEM scans at different tilt angles or four SEM images obtained by a 4 quadrant detector. 3D enhancement for single SEM images. Real-time 3D visualization at any zoom level or angle – SEM image overlays on 3D topography for enhanced rendering. SEM image enhancement and correction – automatic bi-colorization, colored 3D intensity maps, enhanced 3D rendering, configurable lighting and height amplification, gray level drift correction and denoising. Topography measurements - distances, step heights, areas, volumes, dimensioning of profile contours and cross-sections extracted from surfaces. Characterization of surface roughness and texture – advanced roughness/waviness filtering techniques – 2D and 3D parameters from Ra to ISO 25178. Advanced surface analysis of small objects, structures and features – morphology, grains and particle sizes and more. Correlative SEM studies – combine SEM images from different detectors (SE + BSE) – colocalize SEM images and 3D surface data from AFM/SPMs and overlay SEM images on 3D topography.

Dedicated surface imaging, analysis and metrology software for 3D optical microscopes and profilers measuring topography - confocal microscopes, interferometric microscopes, digital holographic microscopes, focus variation microscopes & structured light systems Compatible with all 3D optical profilers and microscopes used for surface analysis and metrology. Real time imaging of 3D surface topography with near-perfect lighting. 3D surface overlays for fast feature location - overlay color and intensity images on 3D topography. Remove data acquisition artifacts - outliers, local defects. Increase field of view virtually - assemble measurements using surface topography stitching. Analyze roughness and surface texture - in accordance with the latest ISO and national standards. Analyze surface geometry - including volume of surface structures (bumps, holes), step heights. Extract and analyze regions of interest - study them in the same way as full measured surfaces. 3D reconstruction of multi-focus images - reconstruct 3D topography from multi-focus image stacks. Easy integration into lab and production environments - export of all numerical results. Easy publication - export analysis documents, pages and individual images up to 1200 dpi. Add optional modules for advanced surface texture analysis, contour analysis, grains and particles analysis, 3D Fourier analysis, image co-localization, statistics and more.