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Dedicated image enhancement, 3D reconstruction and metrology software for scanning electron microscopes (SEM) SEM image colorization made easy - Go from black and white to color effortlessly in just a few clicks. Superfast 3D reconstruction of surface topography in a matter of seconds - from SEM anaglyphs, two successive SEM scans at different tilt angles or four SEM images obtained by a 4 quadrant detector. 3D enhancement for single SEM images. Real-time 3D visualization at any zoom level or angle – SEM image overlays on 3D topography for enhanced rendering. SEM image enhancement and correction – automatic bi-colorization, colored 3D intensity maps, enhanced 3D rendering, configurable lighting and height amplification, gray level drift correction and denoising. Topography measurements - distances, step heights, areas, volumes, dimensioning of profile contours and cross-sections extracted from surfaces. Characterization of surface roughness and texture – advanced roughness/waviness filtering techniques – 2D and 3D parameters from Ra to ISO 25178. Advanced surface analysis of small objects, structures and features – morphology, grains and particle sizes and more. Correlative SEM studies – combine SEM images from different detectors (SE + BSE) – colocalize SEM images and 3D surface data from AFM/SPMs and overlay SEM images on 3D topography.

Dedicated Scanning Probe Microscope imaging, analysis and metrology software (SPM, AFM, STM, CSAFM, KPFM, MFM, NSOM, etc.) Compatible with all scanning probe microscope techniques for nano surface imaging and analysis. Real time 3D multi-channel imaging of SPM topography, phase, defection, current, auxiliary and other layers including overlays. High quality SPM imaging with powerful image optimization and enhancement tools. Intelligent SPM image artifact correction, scan line by line leveling, noise filtering. Comprehensive nano surface analysis including nano-geometry and roughness. Numerous optional modules including AFM force curve analysis and colocalization of SPM images with SEM and other images. Smart user interface for maximum ease of use combined with powerful automation features - including multiple topography image stitching - to accelerate analysis. Easy integration into research and lab environments including export of numerical data and images for easy post-processing and publication.

Dedicated image analysis software for optical microscopes and laboratory images MountainsMap® Image software makes it possible to: Add dimensions to your images and turn them into metrology data. Extract horizontal contours for geometric dimensioning. Quantify binary, grayscale and color-shaded spots, grains and particles. Enhance image quality and remove defects. Convert color images into 3D for better understanding of color variation. Link images with other types of surface data handled by Mountains®.

Dedicated spectrometry software for Raman and FTIR spectrometers Visualization & analysis of spectra & hypercubes MountainsMap® HyperSpectral software provides: interactive visualization of spectra, series of spectra and hypercubes hypercube density mapping and compositional analysis 3D analysis of flattened hypercubes. All of this in a comfortable desktop publishing environment where you can create comprehensive and accurate surface analysis reports with ease. Optional modules are available for advanced and specialist applications, including grains and particles analysis.