Sub surface - Import export

Dedicated imaging, analysis and metrology software for scanning 3D surface profilometers using contact or non-contact techniques - including stylus profilers, laser triangulation profilers, confocal point sensor profilers, auto-focus profilers and white light interferometers Compatible with all scanning 3D surface profilometers used for surface analysis and metrology. Real time 3D imaging of surface topography - at any zoom level, angle and height amplification. Correct measurement artifacts - spikes, anomalous scan lines, missing data points, tip impact. Analyze surface geometry - distances, angles, areas, volumes, step heights, coplanarity. Apply advanced roughness/waviness filtering techniques - defined in ISO 16610. Analyze surface texture - in accordance with the latest ISO and national standards, including ISO 25178 and ISO 4287. Extract and analyze sub-surfaces - study them just like full measured surfaces. Increase profilometer vertical range virtually in software - combine measurements made at different heights. Easy integration into lab and production environments - export of all numerical results. Add optional modules for advanced surface texture and form analysis, contour analysis, grains and particles analysis, FFT-based analysis and more.