3d measuring equipment Russia

... - A-Scan - Patch Scan - Top Scan - Counterfeit Detection - B-Scan - Focus B - Sub B - Cross B - C-Scan - Dual Gate - SALI - SALI Groups - TX-Scan - Concurrent PE/TX - D-Scan - 3D XYZ resolution:1 μm Working area:400x400x200 mm Travel Speed:500 mm/s Scanning speed:from 20 mm/s at 50 MHz frequency...

... feedback control can be used for local subpicoliter injections to single cells SICM (Scanning Ion Conductance Microscopy) is an SPM technique which uses nanopipette (sharp glass electrode) for noncontact 3D surface mapping at high resolution. In SICM, the probe to sample distance is controlled via the decrease of ionic current flowing through the tip, as it approaches the sample surface. Biophys.Journ...