OSTEC ARTTOOL LIMITED COMPANY - Manufacturer of industrial and scientific instruments and equipment

OMOS M series analytical metallographic systems make perfect solutions for the microstructure of materials automatic analysis. When you image and analyze samples, you are often faced with complex and interrupted processes that can make tasks take much longer than you want them to. OMOS M series microscopes have vast experience in bringing together optical precision, automation, analytical power, and data management via the workfloworiented system. The new M series analytical metallographic system product range takes this one step further, offering peerless flexibility and ease of use that can make any task a controlled workflow. Ostec is dedicated to ensuring that the best solutions are available for your work, from microscopes and digital cameras to software and data storage. OMOS M series microscopes bring all of our experience to you, giving you control over every aspect of your hardware, workflow

IROS 03 Fourier infrared spectrometer is designed to record absorption spectra of solid, liquid, and gaseous substances in the near and medium IR region (including drugs, varnishes and paints, oil products, pharmaceuticals, polymer films, and fibers) with their subsequent identification, as well as for qualitative and quantitative analysis of mixtures containing several components. Main Advantages: - Unique misalignment-free, humidity and temperature change resistant Double Cat’s Eye interferometer - Sealed drainable optical unit - The ability to expand the spectral range using additional radiation sources, detectors and beam splitters - Three ports for connecting external devices - Great variety of extension modules IROS 03 FTIR Spectrometer can be equipped with a large number of extension modules. It makes possible to use IROS 03 for different common and specific applications.

IMOS Interference Microscope-nanoprofilometer enables accurate, quantitative, ISOcompliant noncontact surface measurements and characterization of micro and nanoscale surface characteristics, capturing up to two million data points in seconds. Choosing the right optical profilometer depends on your application requirements, including speed, accuracy, vertical range, automation and flexibility. IMOS optical surface profilometer provides powerful versatility in noncontact optical surface measurements. The system makes it easy and fast to investigate a wide range of surface types, including smooth, rough, flat, sloped and stepped surfaces. All measurements are nondestructive, fast and require no special sample preparation.

Applications: - Real-time A-scan & A-scan Capture - B-scan & SLICE - Threshold Mapping (post-processing) - Frequency Domain Imaging (FFT) - C-scan with Multi-gate SALI & SALI Groups - Cluster Analysis (post processing) - Advanced Time-of-Flight & Thickness Measurements - Scan Math Before and After Reflow Characterization - 3D Imaging - Void Gating (real-time) Available modes: - A-Scan - Patch Scan - Top Scan - Counterfeit Detection - B-Scan - Focus B - Sub B - Cross B - C-Scan - Dual Gate - SALI - SALI Groups - TX-Scan - Concurrent PE/TX - D-Scan - 3D

Ostec offers the industrial chemistry analyzer LIOS OnLine intended for quick and safe check of processes by means of continuous onstream analysis of product’s chemical composition directly on conveyor belts or in pipelines for suspensions/liquids if such analyses are made on a real-time basis exclusive of sampling, delay in laboratory analysis and any types of hazardous radiation. LIOS OnLine analyzer will allow you to: - enhance the effectiveness and improve stability of production processes; - lower production costs of commercially useless materials removing them prior to further processing; - reduce losses in feedstock; - reduce operational costs thanks to savings in electrical energy, water and reagents due to identification of process problems at early stages; - provide your clients with quality products meeting all the requirements. Based on feedback from our customers the typical payback period of LIOS OnLine is 3-9 months only.

LIOS 500N is a modern powerful instrument that incorporates innovative technologies in spectroscopy, lasers, and software enabling unique measurements of chemical elements in a sample as well as 2D, 3D elemental mapping, and in-depth profiling. The most convenient and efficient analytical technique of choice for a wide range of applications. Main advantages: - Universality (no need to restart the instrument while analyzing different materials) - Easy and fast analysis (little to no sample preparation) - Highest analytical flexibility (variations in a sample shape and size may be infinite) - High-Speed Analysis - Wide range of concentrations (from ppm to tens of percent) - High accuracy measurements and stability - Low cost of a single analysis, minimum consumables The optical layout offers the ability to make analysis of chemical composition in a small area of inhomogeneous samples, provides elemental mapping and layer-by-layer analysis.

SE0S 02 is the best solution for the customers, who need quick analysis, high specifications, safety and fair accuracy of element composition identification results in metal production at minimal purchase, commission and operating of the device costs. Applications: - Industrial analytical laboratories of metallurgical and machine-building factories; - Express analysis of alloys while melting at workshops; - Identification of alloy grade at warehouses; - Research institutes and universities. SEOS 02 identifies the composition of iron alloys (all types of steel and cast iron) and nonferrous alloys on any basis (Al, Cu, Zn, Ni, Ti, Mg, Co, Pb, etc.). CCD allows to analyze the whole range of basic elements used in metallurgy, including S, P, C. SEOS 02 measurement accuracy is in accordance with international regulatory documents. Every SEOS 02 spectrometer passes the state verification procedure as a measuring instrument.

Multipurpose industrial IR Fourier spectrometers IROS P series are designed for routine analytical measurements in the mid-IR and near-IR region of the spectrum, in particular, qualitative and quantitative analysis of samples of organic and inorganic substances in gaseous, liquid and solid state, including films and powders. IROS P series FTIR spectrometers are based on the Michelson self-compensating interferometer which does not require dynamic adjustment and has the ability to install in the cell compartment a variety of gas and liquid cells, optical attached modules and accessories for liquid, solid and gaseous samples. Main characteristics: - Spectrometers product range with resolution up to 0.12 cm-1 - High sensitivity, rapid response - Automated measurements, easy to use - Wide range of accessories - Application software for dedicated tasks KBr/Ge/CaF2/Ge, optical windows and beamsplitter with moisture-proof coating