Germany
Manufacturer/ Producer
Germany
A stereo microscope system for the microelectronics, electronics, and medical device manufacturing industries. It has a magnification range from 5x up to 30x allowing users to change quickly from a large surface overview to detailed observation. It also has an optimal depth of field (DOF), up to a diameter of 13.6 mm, due to the Leica FusionOptics Technology. A larger DOF means less refocusing which saves users time and simplifies the microscope operation and sample handling. The maximum working distance of 122 mm offers users good access under the microscope when working on components or parts, so plenty of room for tools and fingers. A LED ring light provides bright and homogenous illumination and can be used with an attachable diffusor accessory for shiny components and parts leading to more comfortable working conditions due to less back reflection.
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The Triple Ion Beam Milling System, Leica EM TIC 3X allows production of cross sections and planed surfaces for Scanning Electron Microscopy (SEM), Microstructure Analysis (EDS, WDS, Auger, EBSD) and, AFM investigations. With the Leica EM TIC 3X you achieve high quality surfaces of almost any material at room temperature or cryo, revealing the internal structures of the sample in a near native state as possible.
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The Leica EM TRIM2 is a high speed milling system with integrated stereomicroscope and LED ring illuminator for trimming of biological and industrial samples prior to ultramicrotomy.
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The Leica EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by SEM, TEM, and LM techniques. An integrated stereomicroscope allows pinpointing and easy preparation of barely visible targets.
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The Leica EM RAPID milling system for pharmaceutical research enables sample preparation for analysis of active ingredient distribution on solid-dose pharmaceuticals. The instrument, using a tungsten carbide or diamond miller, decapsulates pills without smearing and features adjustable cutting speeds between 300 and 20,000 rpm, defined step-layer removal, low-noise extraction and filtration with a Hepa filter and single or multiple holders.
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The EM ACE600 sputter coater is a versatile high vacuum film deposition instrument for your FE-SEM and TEM applications. Whether you need to •enhance contrast by a fine-grained metal layer, •produce nanometer thin but robust carbon films, •rotary shadow your sample to make smallest features visible, or to •move into cryo-coating, the ACE600 coater will offer the optimal solution to see more, and this every time.
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High quality sectioning of specimens for light, electron, and atomic force microscopy examination has never been easier and more precise. Leica Microsystems introduces its latest specimen preparation technology: the Leica EM UC7 ultramicrotome and the Leica EM FC7 cryo chamber attachment.
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The SENTERRA II defines a new level of spectroscopic performance and user friendliness in the class of compact Raman microscopes. SENTERRA II is designed to deliver excellent sensitivity combined with high spectral and imaging performance. Therefore the SENTERRA II is a powerful platform for advanced research applications. Due to its high degree of automation, compact size and efficient workflow the SENTERRA II is likewise an ideal tool for solving real world tasks in the quality control laboratory. Its unprecedented permanent stability of the wavenumber axis guarantees precise and accurate results at every time. The SENTERRA II is THE Raman microscope for both, the multi-user environment with high daily throughput and for the lab working at the forefront of scientific research.
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The HYPERION II microscope combines FT-IR and infrared laser imaging (ILIM) microscopy in a single instrument for the first time. It offers all three measurement modes: transmission, reflection and ATR. Now, users have the unique opportunity to use an IR microscope that offers both, the reliability and precision of FT-IR and the tremendous speed advantage of IR laser imaging, all in one.
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The RAM II is the first dual channel FT-Raman module that can be coupled to the VERTEX FT-IR research spectrometer series. Utilizing the input and output port of an INVENIO, VERTEX 80 or the related vacuum versions VERTEX 70v und VERTERX 80v the RAM II provides the ideal FT-Raman measurement device. The intuitive, easy-to-use OPUS software controls all data collection and manipulation functions for the system and allows automated switching between FT-Raman and FT-IR measurements.
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Our uncoated Precision Ball Lenses can be achieve a very high level of yield of magnification & are widely used for focusing & coupling light into and out of Microscopes. We can offer these in Sapphire, made from Al2O3, and BK7 or equivalent material. Sapphire allows for superior optical transmission qualities The key feature of ball lenses is their short back focal length allowing for precision coupling where size or space is a limiting factor in the system & therefore ideal in the use of Microscopes or microscopic attachments onto devices such as mobile phones. Ball Lenses are manufactured from a single substrate of glad and therefore, depending on the geometry of the input source, can focus or collimate light. Half Ball Lenses can also be used as an interchange with a full ball lens for more compact designs. Read the PDF for more information....
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