Measuring equipment - Import export

AMT&C LLC for many years is engaged in design and manufacture of the measuring equipment intended for research of magnetic properties of materials. In the field of the magnetocaloric effect (MCE) these products continue own scientific interests of the AMT&C company employees, recognized experts in this realm of physics. Manufacture of the scientific equipment is based on the following core technologies, backed by patents and numerous know-how: - a wide experience in design and manufacture of complicated magnetic systems, including the adjustable magnetic field generators, controlled by a computer; - use of the most advanced products and ideas in the field of measuring technics; - the magnetic field source and data acquisition system are controlled by means of the specialized software that allows to create setups operating in automatic mode; as a rule, the LabView based software is used. Since 2009 AMT&C LLC produces the measuring equipment under trade mark "MagEq".

The heat capacity measuring insert is intended for measurement of the heat capacity temperature dependencies in constant magnetic field. In this insert the adiabatic method is used. The inner sample holder is equipped with the resistive heaters, resistive temperature sensors and Hall sensor. The heat capacity measurement insert characteristics: - relative measurement accuracy of heat capacity: 3 %; - sample dimensions: a rectangular bar 4×5×2.5 mm; - temperature interval – from 80 to 370 K; - magnetic field interval – from 0.02 to 2 T.

The thermal conductivity measuring insert is intended for measurement of the thermal conductivity coefficient temperature dependencies in constant magnetic field using stationary method. The inner sample holder is equipped with the resistive heaters, resistive temperature sensors and Hall sensor. The thermal conductivity measuring insert characteristics: - relative measurement accuracy of thermal conductivity coefficient: 3 %; - sample dimensions: a rectangular plate 22×4×2 mm; - temperature interval – from 80 to 370 K; - magnetic field interval – from 0.02 to 2 T.

AMT&C LLC offers the wide variety of measuring inserts under customized requirements. Measuring inserts are designed for operation with Halbach-type adjustable magnetic field source, for following applications: - ac susceptibility; - dc susceptibility and magnetization measurements; - torque magnetometry; - heat capacity measurements; - electro-transport measurements; - thermal transport measurements.

Induction magnetometer allows to measure magnetic field isotherms of magnetization (magnetization versus magnetic field (M(H) dependences) in the fields up to 2 T and in the temperature interval from 80 to 370 K. Magnetization is measured by induction method. Specification: - temperature interval — from 80 to 370 К, - magnetic field interval — from 0,02 to 2 Т, - relative measurement accuracy of magnetization - 2 %, - maximal sample dimensions - Ø1.5 × 3.7 mm. Magnetometer (its measuring part) consists of the measuring insert, electronic module and control and data acquisition program and can be used together with the magnetocaloric measuring setup (which includes permanent magnet adjustable magnetic field source, liquid nitrogen cryostat, temperature controller, 2 digital voltmeters, control computer with corresponding interface and control boards).

Experimental setup for express measurements of the adiabatic temperature change in the room temperature range. The setup is intended for measurements of the magnetocaloric effect (MCE), namely adiabatic temperature change (ΔТ), in the temperature range from 273 to 370 K in order to get ΔТ versus temperature dependences rapidly and evaluate suitability of using of the material under investigation as a working body of magnetic refrigerators. The measurements in the setup are conducted by the direct method with the help of a thermocouple. The magnetic field change is accomplished by linear movement of the permanent magnet magnetic field source along the measuring insert. The setup operates in automatic mode under control of the program written on LabView. The setup includes: - the desktop measuring unit, - the desktop control unit, - the ΔТ measuring system, - the control computer. The enhanced algorithm of the setup operation makes possible to investigate up to 20 samples per day.

LLC "AMT&C" offers automatic measuring system (AMS) for measurements of the magnetocaloric effect and other magnetic parameters. AMS includes: - Halbach-type magnetic field source with changing magnetic field based on permanent NdFeB magnets, - liquid nitrogen cryostat, - the set of measuring inserts, - data acquisition and measurements control system guided by a control computer. AMS has the following working parameters: - variable magnetic field strength - from -1.85 to +1.85 T, - variable frequency of the magnetic field change from 0.1 to 1.8 Hz (magnetic field change rate from 0.05 to 6 T/s), - dimensions of the magnetic field area with heterogeneity no more than 1 % - diameter 20 mm, length 20 mm, - working temperature region – 80 ÷ 365 К, - automatic and manual measuring modes. The basic option of AMS is the magnetocaloric effect measurement. - sample dimensions (min-max) (1-2)×(2-5)×(8-10) mm, - measurement accuracy of magnetocaloric effect: 0.1 K.

SE0S 02 is the best solution for the customers, who need quick analysis, high specifications, safety and fair accuracy of element composition identification results in metal production at minimal purchase, commission and operating of the device costs. Applications: - Industrial analytical laboratories of metallurgical and machine-building factories; - Express analysis of alloys while melting at workshops; - Identification of alloy grade at warehouses; - Research institutes and universities. SEOS 02 identifies the composition of iron alloys (all types of steel and cast iron) and nonferrous alloys on any basis (Al, Cu, Zn, Ni, Ti, Mg, Co, Pb, etc.). CCD allows to analyze the whole range of basic elements used in metallurgy, including S, P, C. SEOS 02 measurement accuracy is in accordance with international regulatory documents. Every SEOS 02 spectrometer passes the state verification procedure as a measuring instrument.

Applications: - Real-time A-scan & A-scan Capture - B-scan & SLICE - Threshold Mapping (post-processing) - Frequency Domain Imaging (FFT) - C-scan with Multi-gate SALI & SALI Groups - Cluster Analysis (post processing) - Advanced Time-of-Flight & Thickness Measurements - Scan Math Before and After Reflow Characterization - 3D Imaging - Void Gating (real-time) Available modes: - A-Scan - Patch Scan - Top Scan - Counterfeit Detection - B-Scan - Focus B - Sub B - Cross B - C-Scan - Dual Gate - SALI - SALI Groups - TX-Scan - Concurrent PE/TX - D-Scan - 3D

IMOS Interference Microscope-nanoprofilometer enables accurate, quantitative, ISOcompliant noncontact surface measurements and characterization of micro and nanoscale surface characteristics, capturing up to two million data points in seconds. Choosing the right optical profilometer depends on your application requirements, including speed, accuracy, vertical range, automation and flexibility. IMOS optical surface profilometer provides powerful versatility in noncontact optical surface measurements. The system makes it easy and fast to investigate a wide range of surface types, including smooth, rough, flat, sloped and stepped surfaces. All measurements are nondestructive, fast and require no special sample preparation.

FiPOS product line from Ostec & art photonics GmbH is a cluster of innovative fiber optic probes and fiber probe couplers designed for inline analytical analysis in a wide spectral range from UV to MidIR (550 cmˉ¹ to 55 550 cmˉ¹). FiPOS family of immersion fiber probes includes ATR, transmission, transflection, fluorescent, and diffuse reflection probes all compatible with any FTMIR, FTNIR or dispersion spectrometer, process photometer, IRLED, or QCL spectral sensor to use inline for PAT applications. FiPOS Fiber Probe Couplers (FPC) couple any FTIR spectrometer with various fiber optic probes and upgrade it to eliminate sampling and to run reaction monitoring inline. Our fiber probe couplers provide high coupling efficiency for ATR – absorption, transmission, or reflection process spectroscopy in a wide spectral range from UV to MidIR to use fiber-coupled FTIR not only with LNcooled MCT detectors but with TEcooled MCT and uncooled IR detectors as well.

OMOS M series analytical metallographic systems make perfect solutions for the microstructure of materials automatic analysis. When you image and analyze samples, you are often faced with complex and interrupted processes that can make tasks take much longer than you want them to. OMOS M series microscopes have vast experience in bringing together optical precision, automation, analytical power, and data management via the workfloworiented system. The new M series analytical metallographic system product range takes this one step further, offering peerless flexibility and ease of use that can make any task a controlled workflow. Ostec is dedicated to ensuring that the best solutions are available for your work, from microscopes and digital cameras to software and data storage. OMOS M series microscopes bring all of our experience to you, giving you control over every aspect of your hardware, workflow

Atomic Force Microscopy is a widely used and powerful technique for investigating materials at a nanoscale range. However, the technique is not simple to use, which elicits varied results between researchers with different levels of experience. NTMDT Spectrum Instruments (formerly NTMDT) have created the intelligent software, ScanT™, inspired by neural networks to make dynamic amplitude modulation AFM (AMAFM) easy for researchers of every skill level. The AFM amplitude modulation (AM) mode, also known as “tapping” or “semicontact”, is based on dependency of cantilever amplitude oscillation on distance between sample surface and tip. This mode is often favored over other AFM modes because it provides minimal impact on the sample and the tip, which can help to preserve both.

RapidScan™ technology is a combination of mechanical design and highend digital electronical solutions which allows to speed up your AFM by an order of magnitude keeping 90 µm inplane scaninng range. All three access are equipped with highprecision closedloop capacitive sensors.

Tip Enhanced Raman Scattering (TERS, nanoRaman) is the technique for enhancement of weak Raman signals and for superresolution Raman imaging with spatial resolution less than 10 nm. As a result of comprehensive research performed together with NTMDT SI customers and partners, we are now able to offer to AFMRaman customers mass produced reproducible TERS probes. TERS imaging requires prolonged tipsample contact at each scanning point but Contact AFM is destructive for both the tip and the sample. Thereby, HD mode is a superior technique for cantilevertype TERS since it noticably increases the tip lifetime and makes possible TERS imaging of soft, loose and fragile samples. Thanks to highspeed HybriD 2.0 Control Electronics the approach and withdrawal optical response signal curve (PMT) can be recorded and processed in realtime. This allows to separate the nearfield from farfield component of optical response and to map it with spatial resolution limited by the tip radius.

Tip Enhanced Raman Scattering (TERS, nanoRaman) is the technique for enhancement of weak Raman signals and for superresolution Raman imaging with spatial resolution less than 10 nm. As a result of comprehensive research performed together with NTMDT SI customers and partners, we are now able to offer to AFMRaman customers mass produced reproducible TERS probes. TERS imaging requires prolonged tipsample contact at each scanning point but Contact AFM is destructive for both the tip and the sample. Thereby, HD mode is a superior technique for cantilevertype TERS since it noticably increases the tip lifetime and makes possible TERS imaging of soft, loose and fragile samples. Vacuum measurements in amplitude modulation (AM) mode requires unacceptably low scanning speeds because of extremely high Qfactor of AFM probes. Being a nonresonant mode, HD mode allows at least 10 times faster imaging speed.

HD Scanning Thermal Microscopy (HD SThM) allows studying local thermal properties simultaneously with QNM measurements. From the hardware point of view it was implemented using AppNano VertiSense™ thermocouple probes. The thermal conductivity and temperature mapping modes (CMM, TMM) can be realized by positioning the AFM laser at the end or the central part of the probe, respectively. HD mode working principle allows exceptional spatial resolution of SThM measurements in comparison to conventional Amplitude Modulation (AM) mode. That was demonstrated in TMM of a microheater sample. SThM and HybriD mode is the winning combination for distinguishing between the constituents of polymer blends as demonstrated in the example of a blend of polystyrene (PS) with low density polyethylene (LDPE) (see below). The difference in thermal conductivity of the polymers (PS – 0.12 W/mK; LDPE – 0.33 W/mK) allows the assignment of the colder matrix to LDPE and the hotter islands to PS.

Early warning and forecasting of the deterioration of engineering materials operating in extreme conditions is a high priority activity within many industrial plants. The ability to perform diagnostics on a plant’s metal work without taking it offline is particularly of high value to industries in the energy, processing and other sectors. Currently diagnostic equipment is only able to discover deterioration in operational pipework and associated equipment after its condition has already reached a dangerous stage of degradation. SOLVER Pipe is a new highprecision and reliable diagnostic system that allows plant managers the ability to decrease risks and achieve incidentfree operation through anticipatory control and scheduled maintenance of materials and equipment within their industrial facilities.Advantage over electron microscopy compact, cheap and does not require complex vacuum technology.

Thermoelectric studies of nanoscale structures like np junctions, conductive nanowires, graphene oxide etc. are currently of a great interest. HD Scanning Thermoelectric Microscopy (HD SThEM) allows nondestructive mapping of Seebeck coefficient with tip radiuslimited spatial resolution. HD SThEM working principle is based on direct measurement of generated voltage when conductive tip and sample under different temperatures contact each other during fast force spectroscopy measurements.

Electrical characterization of objects, that are weakly attached to the surface, has always been a challenge when using standard AFM modes like Conductive AFM. This was because often the tip moved or abraded the objects of interest. HybriD Mode drastically decreased the impact of lateral forces and simplified these experiments. Comparison of conductive and mechanical maps shown in this example allows the clear identification of single nanotubes and bundles. New stateoftheart HybriD 2.0 control electronics allows simultaneous resonant electrostatic studies using twopass technique Kelvin Probe Force Microscopy Electrostatic Force Microscopy Scanning Capacitance Force Microscopy

In HD Piezoresponse Force Microscopy mode (HD PFM) an AC voltage is applied to the conductive AFM cantilever when the tip comes in contact with the sample during each fast force spectroscopy cycle. Applied AC voltage causes mechanical oscillations of the piezoelectric (ferroelectric) sample.Corresponding vertical and lateral motions of the AFM tip are recorded and processed to get the amplitude and phase characterizing the local piezoelectric coefficient and local polarization direction respectively. Since the AFM tip retracts from the surface in each scanning point, the lateral tipsample interaction force is significantly reduced in comparison to the conventional contact PFM technique. This provides new capabilities for piezoresponse studies of soft, loose and fragile objects like biological samples, nanoparticles etc. Furthermore an AFM cantilever of higher stiffness and resonance frequency can be used.

Force spectroscopy is a wellknown AFM technique for quantification of local nanomechanical properties. HD mode allows fast, more than 1000 force curves per second measurements, realtime calculation of Young’s modulus according to Hertz, DMT, JKR and other mathematical models and automated cantilever force constant calibration. HybriD Mode uniquely enables stiff materials to be distinguished from each other by means of an AFM probe. Areas corresponding to Bismuth (32 GPa, blue color) and Tin (50 GPa, yellow color) are clearly identified. The mechanical properties map corresponds well with the surface potential image.

Rebirth of Force Spectroscopy Advanced Nanomechanical, Electrical, Optical, Thermal and Piezoresponse Studies Fast Quantitative Nanomechanical Measurements and Force Volume Simultaneous Electrostatic and Nondestructive Conductivity, Piezoresponse and Thermal Studies Advanced CantileverType TipEnhanced Raman Scattering and Scanning NearField Optical Microscopy Topography in Attraction and Repulsive Regimes Young’s Modulus and Force Volume Adhesion and Work of Adhesion Conductivity InPlane and OutofPlane Piezoresponse Temperature and Thermal Conductivity Thermoelectric Electrostatic Kelvin Probe Force, Electrostatic Force and Scanning Capacitance Force Microscopy NearField Component of Optical Response TipEnhanced Raman Scattering In HybriD mode the tipsample distance is modulated according to the quasiharmonic law.

AFM holds a strong positions in scientific research as is used as a routine analytical tool for physical properties characterization with high spatial resolution down to atomic level. Solver Nano is the best choice for scientists who are need a single instrument that is an affordable, robust, userfriendly and professional tool. Solver Nano is designed by the NTMDT SI team that also created High Performance Systems like NTEGRA, NEXT II and NTEGRA Spectra II which have been proven in the scientific community through many key publications. Solver Nano is equipped with a professional 100 micron CL (closed loop XYZ) piezotube scanner with low noise capacitance sensors. Capacitance sensors in comparison with strain gauge and optical sensors have lower noise and higher speed in the feedback signal. The CL scanner is controlled by a professional workstation and software. These capabilities enable all of the basic AFM techniques in compact SPM design.

Ultimate imaging quality with buildin acoustic and vibration isolation, active thermostabilization, industry lowest 25 fm/√Hz optical beam deflection sensor noise and unique design of scanningbytip system allow routine high resolution imaging. Equipped with 50+ AFM modes including HybriD mode all cuttingedge nanomechanical, electrical and magnetic studies are available in basic configuration. Automated study of samples arrays by userdefined scenario with database image storage. Up to 200×200 mm and 40 mm in height samples inspection in any point with 1 μm positioning accuracy. Smart ScanT™ software for oneclick optimization of scanning parameters. This is not just an algorithm, it is rather a unique companion that helps a newcomers in AFM to get industry quality images and assists the experts. Wide possibilities of customization integration of addition optical equipment

Industry leading automation level Outstanding noise floor and thermal drifts Fast scanner with XYZ lownoise closeloop Routine atomic resolution 60+ SPM modes in basic configuration Continuous zoom from millimeter to nanometer range Integrated with new Atomic Force Microscopy technique HybriD Mode™ Atomic Force Microscope NEXT provides motorized sample positioning and integrated high resolution optical microscope positioning, motorized continuous zoom and focusing of the optical microscope. But AFM automation is more than just motorization. Powerful Nova PX software algorithms remove a gap between optics and AFM providing continuous zoom from huge panoramic optical view down to atomic resolution. Since all step movers are coupled together with the optical image, NEXT provides autofocus, fast oneclick cantilever alignment, panoramic optical view and multiple scanning on 5×5 mm range.Cantilever recognition and automatic laser alignment both in liquid and air Autofocus

NTEGRA is a multifunctional device for performing the most typical tasks in the field of Scanning Probe Microscopy. The device is capable of performing more than 40 measuring methods, what allows analyzing physical and chemical properties of the surface with high precision and resolution. It is possible to carry out experiments in air, as well as in liquids and in controlled environment. The new generation electronics provides operations in highfrequency (up to 5MHz) modes. This feature appears to be principal for the work with highfrequency AFM modes and using highfrequency cantilevers.* There are several scanning types implemented in NTEGRA scanning by the sample, scanning by the probe and dualscanning. On account of that, the system is ideal for investigating small samples with ultrahigh resolution (atomicmolecular level) as well as for big samples and scanning range up to 100x100x10 µm.

IR s‑SNOM microscopy and spectroscopy with 10 nm spatial resolution Wide spectral range of operation 312 μm Incredibly low thermal drift and high signal stability Versatile AFM with advanced modes SRI (conductivity), KPFM (surface potential), SCM (capacitance), MFM (magnetic properties), PFM (piezoelectric forces) HybriD Mode™ quantitative nanomechanical mapping Integration with microRaman (optional) The ability of s‑SNOM measurements in the visible spectral range (optional) NTMDT Spectrum Instruments presents NTEGRA Nano IR scattering scanning nearfield optical microscope (s‑SNOM) designed for infrared (IR) spectral range. AFM probe is located in the focus of optical system which excites sample structure by IR laser and collects the optical response. Collected light is directed to Michelson interferometer for optical analysis.

Highperformance versatile AFM Optical access from top, side and bottom optimized for Raman, TERS and SNOM Flexible optical design providing any combination of excitation/collection configurations Automated AFM laser, probe and photodiode alignment Userfriendly change of wavelength of AFM registration system laser and photodiode Easy and userfriendly change of objectives Integration with IR sSNOM (optional) Since 1998 NTMDT has been successfully integrating AFM with optical microscopy and spectroscopy techniques. More than 30 basic and advanced AFM modes including HybriD ModeTM are supported providing extensive information about the sample surface physical properties. Integration of AFM with confocal Raman/fluorescence microscopy provide the widest range of additional information about the sample. Simultaneously measured AFM and Raman maps of exactly the same sample area provide complementary information about sample physical properties (AFM) and chemical composition (Raman).