Probe card with lamella contact elements, especially suitable for RF applications with a high design variety.
Germany
Contacting of all common RF connectors: For frequencies up to 20 GHz, with smart design for highest reliability and easy mounting.
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MµProbe® probe cards are characterized by MEMS contact elements and are particularly suitable for fine pitch full array applications in wafer test.
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Feinmetall test connectors are available for many interfaces such as RJ, USB, HDMI and others. They can be installed very easily and effectively in test fixtures and test modules.
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Four-pole measurement at minimum space: coaxial contact probes with inner conductor as sense pin, from smallest pitches up to highest currents.
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