Ntegra Spectra Ii - AFM-Raman-Nano-IR Systems

Highperformance versatile AFM Optical access from top, side and bottom optimized for Raman, TERS and SNOM Flexible optical design providing any combination of excitation/collection configurations Automated AFM laser, probe and photodiode alignment Userfriendly change of wavelength of AFM registration system laser and photodiode Easy and userfriendly change of objectives Integration with IR sSNOM (optional) Since 1998 NTMDT has been successfully integrating AFM with optical microscopy and spectroscopy techniques. More than 30 basic and advanced AFM modes including HybriD ModeTM are supported providing extensive information about the sample surface physical properties. Integration of AFM with confocal Raman/fluorescence microscopy provide the widest range of additional information about the sample. Simultaneously measured AFM and Raman maps of exactly the same sample area provide complementary information about sample physical properties (AFM) and chemical composition (Raman). Diffraction limited spatial resolution:<200 nm in XY, <500 nm in Z (with immersion objective) High-performance low noise AFM:Z noise<0.1 nm (RMS in 10‑1000 Hz bandwidth) Echelle grating with ultrahigh dispersion; spectral resolution:0.007nm (< 0.1 cm‑1) Low wavenumber/THz Raman spectroscopy:<10 cm-1 with Bragg volume filters Exchangeable objectives with kinematic mounts:precision <2 µm Dual scan:scan by sample AND scan by laser spot (for Hot Spot mapping in TERS) All existing TERS geometries are available:illumination/collection from bottom, from top or from side